Ting-Ju WU

Person

CHU-PEI CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device test method and test device
- Patent number 11,994,558
- Issue date May 28, 2024
- Realtek Semiconductor Corp.
- Han-Yun Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe card and manufacturing method thereof
- Patent number 11,874,313
- Issue date Jan 16, 2024
- MPI CORPORATION
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing memory calibration, associated system on chip...
- Patent number 11,862,224
- Issue date Jan 2, 2024
- Realtek Semiconductor Corp.
- Tse-Yi Hsieh
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe head and probe card
- Patent number 11,733,267
- Issue date Aug 22, 2023
- MPI CORPORATION
- Che-Wei Lin
- G01 - MEASURING TESTING
Information Patent Grant
Power line structure
- Patent number 11,711,888
- Issue date Jul 25, 2023
- Realtek Semiconductor Corporation
- Chun-Ming Huang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fuel cell bipolar flow field plate and fuel cell stack
- Patent number 11,670,781
- Issue date Jun 6, 2023
- National Tsing Hua University
- Ting-Cheng Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic band gap structure apparatus
- Patent number 11,375,608
- Issue date Jun 28, 2022
- Realtek Semiconductor Corporation
- Hsin-Chan Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic package structure with a core ground wire and chip thereof
- Patent number 11,264,352
- Issue date Mar 1, 2022
- Realtek Semiconductor Corp.
- Ting-Ying Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beamforming device, calibration method and calibration system for t...
- Patent number 11,239,552
- Issue date Feb 1, 2022
- Wistron NeWeb Corporation
- Chih-Min Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device including noise-suppressing mechanism
- Patent number 10,998,016
- Issue date May 4, 2021
- Realtek Semiconductor Corporation
- Chin-Yuan Lo
- G11 - INFORMATION STORAGE
Information Patent Grant
Vertical probe device and supporter used in the same
- Patent number 10,119,991
- Issue date Nov 6, 2018
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Ball grid array formed on printed circuit board
- Patent number 9,955,586
- Issue date Apr 24, 2018
- Realtek Semiconductor Corp.
- Ting-Ying Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-capacitor-based filter design method and two-capacitor-based fi...
- Patent number 9,948,280
- Issue date Apr 17, 2018
- Realtek Semiconductor Corporation
- Po-Chun Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Assembling method and maintaining method for vertical probe device
- Patent number 9,465,050
- Issue date Oct 11, 2016
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Impedance correction device and method thereof
- Patent number 8,614,585
- Issue date Dec 24, 2013
- Realtek Semiconductor Corp.
- Wen-Shan Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND MANUFACTURING METHOD THEREOF
- Publication number 20240118316
- Publication date Apr 11, 2024
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
LAYOUT METHOD AND RELATED NON-TRANSITORY COMPUTER-READABLE MEDIUM
- Publication number 20230205964
- Publication date Jun 29, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- TZE-MIN SHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE TEST METHOD AND TEST DEVICE
- Publication number 20230132675
- Publication date May 4, 2023
- Realtek Semiconductor Corp.
- Han-Yun Tsai
- G11 - INFORMATION STORAGE
Information Patent Application
FUEL CELL BIPOLAR FLOW FIELD PLATE AND FUEL CELL STACK
- Publication number 20220376273
- Publication date Nov 24, 2022
- National Tsing-Hua University
- Ting-Cheng Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PERFORMING MEMORY CALIBRATION, ASSOCIATED SYSTEM ON CHIP...
- Publication number 20220238149
- Publication date Jul 28, 2022
- Realtek Semiconductor Corp.
- Tse-Yi Hsieh
- G11 - INFORMATION STORAGE
Information Patent Application
PROBE CARD AND MANUFACTURING METHOD THEREOF
- Publication number 20220170961
- Publication date Jun 2, 2022
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
POWER LINE STRUCTURE
- Publication number 20210368614
- Publication date Nov 25, 2021
- REALTEK SEMICONDUCTOR CORPORATION
- Chun-Ming HUANG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTROMAGNETIC BAND GAP STRUCTURE APPARATUS
- Publication number 20210185799
- Publication date Jun 17, 2021
- REALTEK SEMICONDUCTOR CORPORATION
- Hsin-Chan HSIEH
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRONIC PACKAGE STRUCTURE AND CHIP THEREOF
- Publication number 20200402948
- Publication date Dec 24, 2020
- Realtek Semiconductor Corp.
- TING-YING WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAMFORMING DEVICE, CALIBRATION METHOD AND CALIBRATION SYSTEM FOR T...
- Publication number 20200373660
- Publication date Nov 26, 2020
- WISTRON NEWEB CORPORATION
- CHIH-MIN HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE HEAD AND PROBE CARD
- Publication number 20200309819
- Publication date Oct 1, 2020
- MPI Corporation
- Che-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE
- Publication number 20200075066
- Publication date Mar 5, 2020
- REALTEK SEMICONDUCTOR CORPORATION
- Chin-Yuan Lo
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT FOR MEMORY SYSTEM AND ASSOCIATED METHOD
- Publication number 20190096444
- Publication date Mar 28, 2019
- Realtek Semiconductor Corp.
- Chih-Chia Chiu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
BALL GRID ARRAY FORMED ON PRINTED CIRCUIT BOARD
- Publication number 20160021745
- Publication date Jan 21, 2016
- Realtek Semiconductor Corp.
- TING-YING WU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME
- Publication number 20150276800
- Publication date Oct 1, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE
- Publication number 20150253358
- Publication date Sep 10, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Electronic device test method and test device

Probe card and manufacturing method thereof

Method for performing memory calibration, associated system on chip...

Probe head and probe card

Power line structure

Fuel cell bipolar flow field plate and fuel cell stack

Electromagnetic band gap structure apparatus

Electronic package structure with a core ground wire and chip thereof

Beamforming device, calibration method and calibration system for t...

Memory device including noise-suppressing mechanism

Vertical probe device and supporter used in the same

Ball grid array formed on printed circuit board

Two-capacitor-based filter design method and two-capacitor-based fi...

Assembling method and maintaining method for vertical probe device

Impedance correction device and method thereof

Patents Applicationslast 30 patents

PROBE CARD AND MANUFACTURING METHOD THEREOF

LAYOUT METHOD AND RELATED NON-TRANSITORY COMPUTER-READABLE MEDIUM

ELECTRONIC DEVICE TEST METHOD AND TEST DEVICE

FUEL CELL BIPOLAR FLOW FIELD PLATE AND FUEL CELL STACK

METHOD FOR PERFORMING MEMORY CALIBRATION, ASSOCIATED SYSTEM ON CHIP...

PROBE CARD AND MANUFACTURING METHOD THEREOF

POWER LINE STRUCTURE

ELECTROMAGNETIC BAND GAP STRUCTURE APPARATUS

ELECTRONIC PACKAGE STRUCTURE AND CHIP THEREOF

BEAMFORMING DEVICE, CALIBRATION METHOD AND CALIBRATION SYSTEM FOR T...

PROBE HEAD AND PROBE CARD

MEMORY DEVICE

CIRCUIT FOR MEMORY SYSTEM AND ASSOCIATED METHOD

BALL GRID ARRAY FORMED ON PRINTED CIRCUIT BOARD

VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME

ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE