Ting-Yu Shen

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Taipei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Asynchronous circuits and test methods
- Patent number 11,500,018
- Issue date Nov 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Grant
Design-for-test for asynchronous circuit elements
- Patent number 11,073,552
- Issue date Jul 27, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Asynchronous circuits and test methods
- Patent number 11,047,911
- Issue date Jun 29, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Grant
Design-for-test for asynchronous circuit elements
- Patent number 10,429,440
- Issue date Oct 1, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Yen Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ASYNCHRONOUS CIRCUITS AND TEST METHODS
- Publication number 20210325458
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Application
ASYNCHRONOUS CIRCUITS AND TEST METHODS
- Publication number 20200132759
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Application
Design-For-Test for Asynchronous Circuit Elements
- Publication number 20200025826
- Publication date Jan 23, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Yen Huang
- G01 - MEASURING TESTING
Information Patent Application
Design-For-Test for Asynchronous Circuit Elements
- Publication number 20190033366
- Publication date Jan 31, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Yen Huang
- G01 - MEASURING TESTING