To-Yu Chen

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Yunlin, TW

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Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING SEMICONDUCTOR DEVICES
- Publication number 20240255435
- Publication date Aug 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shao-Chien Chiu
- H01 - BASIC ELECTRIC ELEMENTS