Toan Tran

Person

Rowlett, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
CMOS-based thermopile with reduced thermal conductance
- Patent number 9,853,086
- Issue date Dec 26, 2017
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS-based thermopile with reduced thermal conductance
- Patent number 9,496,313
- Issue date Nov 15, 2016
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a CMOS-based thermoelectric device
- Patent number 9,437,799
- Issue date Sep 6, 2016
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS-based thermoelectric device with reduced electrical resistance
- Patent number 9,231,025
- Issue date Jan 5, 2016
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures for testing and locating defects in integrated circuits
- Patent number 7,772,867
- Issue date Aug 10, 2010
- Texas Instruments Incorporated
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Grant
Reliable high voltage gate dielectric layers using a dual nitridati...
- Patent number 7,560,792
- Issue date Jul 14, 2009
- Texas Instruments Incorporated
- Rajesh Khamankar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate dielectric having a flat nitrogen profile and method of manufa...
- Patent number 7,345,001
- Issue date Mar 18, 2008
- Texas Instruments Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliable high voltage gate dielectric layers using a dual nitridati...
- Patent number 7,183,165
- Issue date Feb 27, 2007
- Texas Instruments Incorporated
- Rajesh Khamankar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized metal fuse process
- Patent number 6,687,973
- Issue date Feb 10, 2004
- Texas Instruments Incorporated
- Melissa M. Hewson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to reduce particulates in device manufacture
- Patent number 5,766,369
- Issue date Jun 16, 1998
- Texas Instruments Incorporated
- Toan Tran
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated bipolar and CMOS transistor with titanium nitride interc...
- Patent number 5,065,208
- Issue date Nov 12, 1991
- Texas Instruments Incorporated
- Rajiv R. Shah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS programmable memories using a metal fuse link and process for m...
- Patent number 4,792,835
- Issue date Dec 20, 1988
- Texas Instruments Incorporated
- Stephen P. Sacarisen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FLASH MEMORY WITH IREAD TUNING
- Publication number 20240040783
- Publication date Feb 1, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Toan Tran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE
- Publication number 20170062518
- Publication date Mar 2, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A CMOS-BASED THERMOELECTRIC DEVICE
- Publication number 20160155925
- Publication date Jun 2, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS-BASED THERMOELECTRIC DEVICE WITH REDUCED ELECTRICAL RESISTANCE
- Publication number 20150349021
- Publication date Dec 3, 2015
- Texas Insturments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE
- Publication number 20150349022
- Publication date Dec 3, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS
- Publication number 20090212793
- Publication date Aug 27, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS...
- Publication number 20090102501
- Publication date Apr 23, 2009
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Application
SHALLOW TRENCH DIVOT CONTROL POST
- Publication number 20080268589
- Publication date Oct 30, 2008
- TEXAS INSTRUMENTS INCORPORATED
- David Gerald Farber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate Dielectric Having a Flat Nitrogen Profile and Method of Manufa...
- Publication number 20080116542
- Publication date May 22, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reliable high voltage gate dielectric layers using a dual nitridati...
- Publication number 20070117331
- Publication date May 24, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Rajesh Khamankar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate dielectric having a flat nitrogen profile and method of manufa...
- Publication number 20050285211
- Publication date Dec 29, 2005
- Texas Instruments, Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor structure and method of fabrication
- Publication number 20040191999
- Publication date Sep 30, 2004
- Texas Instruments Incroporated
- Pr Chidambaram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reliable high voltage gate dielectric layers using a dual nitridati...
- Publication number 20040102010
- Publication date May 27, 2004
- Rajesh Khamankar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optimized metal fuse process
- Publication number 20020062549
- Publication date May 30, 2002
- Melissa M. Hewson
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

CMOS-based thermopile with reduced thermal conductance

CMOS-based thermopile with reduced thermal conductance

Method of forming a CMOS-based thermoelectric device

CMOS-based thermoelectric device with reduced electrical resistance

Structures for testing and locating defects in integrated circuits

Reliable high voltage gate dielectric layers using a dual nitridati...

Gate dielectric having a flat nitrogen profile and method of manufa...

Reliable high voltage gate dielectric layers using a dual nitridati...

Optimized metal fuse process

Method to reduce particulates in device manufacture

Integrated bipolar and CMOS transistor with titanium nitride interc...

MOS programmable memories using a metal fuse link and process for m...

Patents Applicationslast 30 patents

FLASH MEMORY WITH IREAD TUNING

CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE

METHOD OF FORMING A CMOS-BASED THERMOELECTRIC DEVICE

CMOS-BASED THERMOELECTRIC DEVICE WITH REDUCED ELECTRICAL RESISTANCE

CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE

STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS

TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS...

SHALLOW TRENCH DIVOT CONTROL POST

Gate Dielectric Having a Flat Nitrogen Profile and Method of Manufa...

Reliable high voltage gate dielectric layers using a dual nitridati...

Gate dielectric having a flat nitrogen profile and method of manufa...

Semiconductor structure and method of fabrication

Reliable high voltage gate dielectric layers using a dual nitridati...

Optimized metal fuse process