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Tobias GNAUSCH
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Jena, DE
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Patents Grants
last 30 patents
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Patent Grant
Wafer-level test method for optoelectronic chips
Patent number
11,906,579
Issue date
Feb 20, 2024
JENOPTIK GmbH
Tobias Gnausch
G01 - MEASURING TESTING
Information
Patent Grant
Position-tolerance-insensitive contacting module for contacting opt...
Patent number
11,480,495
Issue date
Oct 25, 2022
Jenoptik Optical Systems GmbH
Tobias Gnausch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS
Publication number
20230296668
Publication date
Sep 21, 2023
JENOPTIK OPTICAL SYSTEMS GMBH
Robert BUETTNER
G01 - MEASURING TESTING
Information
Patent Application
CONTACTING MODULE FOR HAVING A MOUNTING PLATE FOR CONTACTING OPTOEL...
Publication number
20230288475
Publication date
Sep 14, 2023
JENOPTIK OPTICAL SYSTEMS GMBH
Robert BUETTNER
G01 - MEASURING TESTING
Information
Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
Publication number
20220397602
Publication date
Dec 15, 2022
Tobias GNAUSCH
G01 - MEASURING TESTING
Information
Patent Application
Position-Tolerance-Insensitive Contacting Module for Contacting Opt...
Publication number
20200378865
Publication date
Dec 3, 2020
JENOPTIK OPTICAL SYSTEMS GMBH
Tobias GNAUSCH
G01 - MEASURING TESTING