Tobias GNAUSCH

Person

Jena, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer-level test method for optoelectronic chips
- Patent number 11,906,579
- Issue date Feb 20, 2024
- JENOPTIK GmbH
- Tobias Gnausch
- G01 - MEASURING TESTING
Information Patent Grant
Position-tolerance-insensitive contacting module for contacting opt...
- Patent number 11,480,495
- Issue date Oct 25, 2022
- Jenoptik Optical Systems GmbH
- Tobias Gnausch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20240369624
- Publication date Nov 7, 2024
- JENOPTIK OPTICAL SYSTEMS GMBH
- Christian KARRAS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND METHOD FOR PRODUCING AN OPTICAL DEVICE
- Publication number 20240361542
- Publication date Oct 31, 2024
- JENOPTIK OPTICAL SYSTEMS GMBH
- Christian KARRAS
- G02 - OPTICS
Information Patent Application
CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...
- Publication number 20240219461
- Publication date Jul 4, 2024
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS
- Publication number 20230296668
- Publication date Sep 21, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE FOR HAVING A MOUNTING PLATE FOR CONTACTING OPTOEL...
- Publication number 20230288475
- Publication date Sep 14, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20220397602
- Publication date Dec 15, 2022
- Tobias GNAUSCH
- G01 - MEASURING TESTING
Information Patent Application
Position-Tolerance-Insensitive Contacting Module for Contacting Opt...
- Publication number 20200378865
- Publication date Dec 3, 2020
- JENOPTIK OPTICAL SYSTEMS GMBH
- Tobias GNAUSCH
- G01 - MEASURING TESTING

Tobias GNAUSCH

Person

Patents Grantslast 30 patents

Wafer-level test method for optoelectronic chips

Position-tolerance-insensitive contacting module for contacting opt...

Patents Applicationslast 30 patents

WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS

OPTICAL DEVICE AND METHOD FOR PRODUCING AN OPTICAL DEVICE

CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...

CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS

CONTACTING MODULE FOR HAVING A MOUNTING PLATE FOR CONTACTING OPTOEL...

WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS

Position-Tolerance-Insensitive Contacting Module for Contacting Opt...