Tobias HOENLE

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Objective, use of an objective, measurement system comprising an ob...
- Patent number 11,789,233
- Issue date Oct 17, 2023
- Jenoptik Optical Systems GmbH
- Tobias Hoenle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OBJECTIVE, USE OF AN OBJECTIVE, MEASUREMENT SYSTEM COMPRISING AN OB...
- Publication number 20230185057
- Publication date Jun 15, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Tobias HOENLE
- G01 - MEASURING TESTING
Information Patent Application
OBJECTIVE, USE OF AN OBJECTIVE AND MEASUREMENT SYSTEM
- Publication number 20220397747
- Publication date Dec 15, 2022
- JENOPTIK OPTICAL SYSTEMS GMBH
- Tobias HOENLE
- G01 - MEASURING TESTING