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Toby Shanley
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Dulwich Hill, AU
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last 30 patents
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Patent Grant
Electron beam microscope with improved imaging gas and method of use
Patent number
9,633,816
Issue date
Apr 25, 2017
FEI Company
Toby Shanley
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE
Publication number
20160343537
Publication date
Nov 24, 2016
FEI Company
Toby Shanley
H01 - BASIC ELECTRIC ELEMENTS