Todd A. CERNI

Person

Mead, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Particle counter with improved image sensor array
- Patent number 7,456,960
- Issue date Nov 25, 2008
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical planarization (CMP) slurry quality control proc...
- Patent number RE39783
- Issue date Aug 21, 2007
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- 356 - Optics: measuring and testing
Information Patent Grant
Optical measurement of the chemical constituents of an opaque slurry
- Patent number 7,088,446
- Issue date Aug 8, 2006
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Grant
Diode pumped intracavity laser particle counter with improved relia...
- Patent number 7,030,980
- Issue date Apr 18, 2006
- Particle Measuring Systems, Inc.
- Dwight A. Sehler
- G01 - MEASURING TESTING
Information Patent Grant
Low noise intracavity laser particle counter
- Patent number 6,903,818
- Issue date Jun 7, 2005
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic measurement of the chemical constituents of a CMP slurry
- Patent number 6,709,311
- Issue date Mar 23, 2004
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical planarization (CMP) slurry quality control proc...
- Patent number 6,275,290
- Issue date Aug 14, 2001
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for measurement of particle size distribution...
- Patent number 6,246,474
- Issue date Jun 12, 2001
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
Particle Counter With Improved Image Sensor Array
- Publication number 20090190128
- Publication date Jul 30, 2009
- Particle Measuring Systems, Inc.
- Todd A. CERNI
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for biometric identification
- Publication number 20080107309
- Publication date May 8, 2008
- Cerni Consulting, LLC
- Todd A. Cerni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Particle counter with improved image sensor array
- Publication number 20060274309
- Publication date Dec 7, 2006
- Particle Measuring Systems Inc
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement of the chemical constituents of an opaque slurry
- Publication number 20050146717
- Publication date Jul 7, 2005
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Application
Low noise intracavity laser particle counter
- Publication number 20040080747
- Publication date Apr 29, 2004
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic measurment of the chemical constituents of a CMP slurry
- Publication number 20030032366
- Publication date Feb 13, 2003
- Particle Measuring Systems, Inc.
- Todd A. Cerni
- G01 - MEASURING TESTING

Todd A. CERNI

Person

Patents Grantslast 30 patents

Particle counter with improved image sensor array

Chemical mechanical planarization (CMP) slurry quality control proc...

Optical measurement of the chemical constituents of an opaque slurry

Diode pumped intracavity laser particle counter with improved relia...

Low noise intracavity laser particle counter

Spectroscopic measurement of the chemical constituents of a CMP slurry

Chemical mechanical planarization (CMP) slurry quality control proc...

Method and apparatus for measurement of particle size distribution...

Patents Applicationslast 30 patents

Particle Counter With Improved Image Sensor Array

Method and apparatus for biometric identification

Particle counter with improved image sensor array

Optical measurement of the chemical constituents of an opaque slurry

Low noise intracavity laser particle counter

Spectroscopic measurment of the chemical constituents of a CMP slurry