Todd A. Dobson

Person

Meridian, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for selective removal of material from wafer...
- Patent number 8,053,371
- Issue date Nov 8, 2011
- Micron Technology, Inc.
- Russell C. Zahorik
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods for selective removal of material from wafer alignment marks
- Patent number 7,244,681
- Issue date Jul 17, 2007
- Micron Technology, Inc.
- Guy F. Hudson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for selective removal of material from wafer alignment marks
- Patent number 6,889,698
- Issue date May 10, 2005
- Micron Technology, Inc.
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for selective removal of material from wafer alignment marks
- Patent number 6,610,610
- Issue date Aug 26, 2003
- Micron Technology, Inc.
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for selective removal of material from wafer alignment marks
- Patent number 6,530,113
- Issue date Mar 11, 2003
- Micron Technology, Inc.
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for selective removal of material from wafer a...
- Patent number 6,447,634
- Issue date Sep 10, 2002
- Micron Technology, Inc.
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for selective removal of material from wafer a...
- Patent number 6,329,301
- Issue date Dec 11, 2001
- Micron Technology, Inc.
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for selective removal of material from wafer a...
- Patent number 6,103,636
- Issue date Aug 15, 2000
- Micron Technology, Inc.
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods for selective removal of material from wafer alignment marks
- Publication number 20070207613
- Publication date Sep 6, 2007
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for selective removal of material from wafer alignment marks
- Publication number 20040038543
- Publication date Feb 26, 2004
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for selective removal of material from wafer alignment marks
- Publication number 20030121538
- Publication date Jul 3, 2003
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for selective removal of material from wafer a...
- Publication number 20020144720
- Publication date Oct 10, 2002
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for selective removal of material from wafer a...
- Publication number 20020025687
- Publication date Feb 28, 2002
- Russell C. Zahorik
- H01 - BASIC ELECTRIC ELEMENTS

Todd A. Dobson

Person

Patents Grantslast 30 patents

Apparatus and methods for selective removal of material from wafer...

Methods for selective removal of material from wafer alignment marks

Apparatus for selective removal of material from wafer alignment marks

Methods for selective removal of material from wafer alignment marks

Apparatus for selective removal of material from wafer alignment marks

Method and apparatus for selective removal of material from wafer a...

Method and apparatus for selective removal of material from wafer a...

Method and apparatus for selective removal of material from wafer a...

Patents Applicationslast 30 patents

Methods for selective removal of material from wafer alignment marks

Methods for selective removal of material from wafer alignment marks

Apparatus for selective removal of material from wafer alignment marks

Method and apparatus for selective removal of material from wafer a...

Method and apparatus for selective removal of material from wafer a...