Todd C. Haber

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Alpharetta, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
Overcoming Rayleigh backscatter in wavelength division multiplexed...
- Patent number 10,727,938
- Issue date Jul 28, 2020
- Luna Innovations Incorporated
- Todd Christian Haber
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for enabling system operation based on a spectral fingerprint
- Patent number 9,851,249
- Issue date Dec 26, 2017
- Micron Optics, Inc.
- Todd Christian Haber
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multiple scan rate swept wavelength laser-...
- Patent number 7,573,021
- Issue date Aug 11, 2009
- Micron Optics, Inc.
- Todd C. Haber
- G01 - MEASURING TESTING
Information Patent Grant
Calibrated tunable fiber fabry-perot filters for optical wavelength...
- Patent number 6,504,616
- Issue date Jan 7, 2003
- Micron Optics, Inc.
- Todd Haber
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OVERCOMING RAYLEIGH BACKSCATTER IN WAVELENGTH DIVISION MULTIPLEXED...
- Publication number 20190280767
- Publication date Sep 12, 2019
- Luna Innovations Incorporated
- Todd Christian HABER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for Enabling System Operation Based on a Spectral Fingerprint
- Publication number 20160245692
- Publication date Aug 25, 2016
- Micron Optics, Inc.
- Todd Christian Haber
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Multiple Scan Rate Swept Wavelength Laser-...
- Publication number 20080296480
- Publication date Dec 4, 2008
- Todd C. Haber
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR HIGH FREQUENCY OPTICAL SENSOR INTERROGATION
- Publication number 20080106745
- Publication date May 8, 2008
- Todd C. Haber
- G01 - MEASURING TESTING