Todd C. Nielsen

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Meridian, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus employing external light source for endpoint d...
- Patent number 6,509,960
- Issue date Jan 21, 2003
- Micron Technology, Inc.
- David R. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus employing external light source for endpoint d...
- Patent number 6,429,928
- Issue date Aug 6, 2002
- Micron Technology, Inc.
- David R. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus employing external light source for endpoint d...
- Patent number 5,969,805
- Issue date Oct 19, 1999
- Micron Technology, Inc.
- David R. Johnson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS EMPLOYING EXTERNAL LIGHT SOURCE FOR ENDPOINT D...
- Publication number 20010046043
- Publication date Nov 29, 2001
- DAVID R. JOHNSON
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus employing external light source for endpoint d...
- Publication number 20010009459
- Publication date Jul 26, 2001
- David R. Johnson
- G01 - MEASURING TESTING