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Todd Frederick Miller
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Mechanicville, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Inertial sensing systems and methods of manufacturing the same
Patent number
11,326,883
Issue date
May 10, 2022
General Electric Company
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensing systems and methods of manufacturing the same
Patent number
10,502,568
Issue date
Dec 10, 2019
General Electric Company
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Extraction of materials from regions of interest in a sample
Patent number
10,494,627
Issue date
Dec 3, 2019
General Electric Company
John Richard Nelson
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Methods and systems for monitoring a dynamic system
Patent number
10,458,839
Issue date
Oct 29, 2019
General Electric Company
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
System and method of electrostatic carouseling for gyrocompassing
Patent number
9,879,996
Issue date
Jan 30, 2018
General Electric Company
Yizhen Lin
G01 - MEASURING TESTING
Information
Patent Grant
Continuous selftest for inertial sensors at 0 Hz
Patent number
9,817,023
Issue date
Nov 14, 2017
NXP USA, INC.
Todd F. Miller
G01 - MEASURING TESTING
Information
Patent Grant
Extraction of materials from regions of interest in a sample
Patent number
9,625,355
Issue date
Apr 18, 2017
General Electric Company
John Richard Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electro-osmotic pump
Patent number
9,103,331
Issue date
Aug 11, 2015
General Electric Company
Christopher Michael Puleo
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Grant
MEMS device with central anchor for stress isolation
Patent number
8,610,222
Issue date
Dec 17, 2013
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vertically integrated MEMS sensor device with multi-stimulus sensing
Patent number
8,220,330
Issue date
Jul 17, 2012
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Apparatus and methods for applying stress-induced offset compensati...
Patent number
8,215,177
Issue date
Jul 10, 2012
FREESCALE SEMICONDUCTOR, INC.
David A. Hayner
G01 - MEASURING TESTING
Information
Patent Grant
Vertically integrated MEMS acceleration transducer
Patent number
8,186,221
Issue date
May 29, 2012
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Multiple axis transducer with multiple sensing range capability
Patent number
7,779,689
Issue date
Aug 24, 2010
FREESCALE SEMICONDUCTOR, INC.
Gary G. Li
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for closed loop offset cancellation
Patent number
7,665,361
Issue date
Feb 23, 2010
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
G01 - MEASURING TESTING
Information
Patent Grant
Differential capacitive sensor and method of making same
Patent number
7,610,809
Issue date
Nov 3, 2009
FREESCALE SEMICONDUCTOR, INC.
Andrew C. McNeil
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INERTIAL SENSING SYSTEMS AND METHODS OF MANUFACTURING THE SAME
Publication number
20200011667
Publication date
Jan 9, 2020
GENERAL ELECTRIC COMPANY
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Application
EXTRACTION OF MATERIALS FROM REGIONS OF INTEREST IN A SAMPLE
Publication number
20170175105
Publication date
Jun 22, 2017
GENERAL ELECTRIC COMPANY
John Richard Nelson
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
SYSTEM AND METHOD OF ELECTROSTATIC CAROUSELING FOR GYROCOMPASSING
Publication number
20170153109
Publication date
Jun 1, 2017
GENERAL ELECTRIC COMPANY
Yizhen Lin
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL SENSING SYSTEMS AND METHODS OF MANUFACTURING THE SAME
Publication number
20170067742
Publication date
Mar 9, 2017
GENERAL ELECTRIC COMPANY
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Application
EXTRACTION OF MATERIALS FROM REGIONS OF INTEREST IN A SAMPLE
Publication number
20160153868
Publication date
Jun 2, 2016
GENERAL ELECTRIC COMPANY
John Richard Nelson
G01 - MEASURING TESTING
Information
Patent Application
CONTINUOUS SELFTEST FOR INERTIAL SENSORS AT 0 HZ
Publication number
20140182351
Publication date
Jul 3, 2014
TODD F. MILLER
G01 - MEASURING TESTING
Information
Patent Application
ELECTROOSMOTIC PUMP AND METHOD OF USE THEREOF
Publication number
20130153425
Publication date
Jun 20, 2013
GENERAL ELECTRIC COMPANY
Christopher Michael Puleo
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Application
MEMS DEVICE WITH CENTRAL ANCHOR FOR STRESS ISOLATION
Publication number
20120262026
Publication date
Oct 18, 2012
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FRAMED TRANSDUCER DEVICE
Publication number
20110174074
Publication date
Jul 21, 2011
FREESCALE SEMICONDUCTOR, INC.
Gary G. Li
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR APPLYING STRESS-INDUCED OFFSET COMPENSATI...
Publication number
20110113891
Publication date
May 19, 2011
FREESCALE SEMICONDUCTOR, INC.
David A. Hayner
G01 - MEASURING TESTING
Information
Patent Application
VERTICALLY INTEGRATED MEMS ACCELERATION TRANSDUCER
Publication number
20100242600
Publication date
Sep 30, 2010
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VERTICALLY INTEGRATED MEMS SENSOR DEVICE WITH MULTI-STIMULUS SENSING
Publication number
20100242603
Publication date
Sep 30, 2010
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CONTINUOUS SELFTEST FOR INERTIAL SENSORS AT 0 HZ
Publication number
20100122565
Publication date
May 20, 2010
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE AXIS TRANSDUCER WITH MULTIPLE SENSING RANGE CAPABILITY
Publication number
20080196499
Publication date
Aug 21, 2008
FREESCALE SEMICONDUCTOR, INC.
Gary G. Li
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CLOSED LOOP OFFSET CANCELLATION
Publication number
20080178671
Publication date
Jul 31, 2008
Todd F. Miller
G01 - MEASURING TESTING
Information
Patent Application
Differential capacitive sensor and method of making same
Publication number
20080173091
Publication date
Jul 24, 2008
FREESCALE SEMICONDUCTOR, INC.
Andrew C. McNeil
G01 - MEASURING TESTING