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Todd M. Beazley
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Aloha, OR, US
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last 30 patents
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Patent Grant
Method for increasing the resolution of measurements taken using a...
Patent number
4,972,139
Issue date
Nov 20, 1990
Tektronix, Inc.
Todd M. Beazley
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for detection of non-linear electrical devices
Patent number
4,547,724
Issue date
Oct 15, 1985
Tektronix, Inc.
Todd M. Beazley
G01 - MEASURING TESTING