Todd Michael Burdine

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
implementing deterministic based broken scan chain diagnostics
- Patent number 7,475,308
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and computer program product for diagnosing a sc...
- Patent number 7,395,470
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for implementing deterministic based broken scan chain diagn...
- Patent number 7,395,469
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and computer program product for diagnosing a sc...
- Patent number 7,392,449
- Issue date Jun 24, 2008
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining the Nth state of linear feedback...
- Patent number 7,340,496
- Issue date Mar 4, 2008
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for selective scan chain diagnostics
- Patent number 7,234,090
- Issue date Jun 19, 2007
- International Business Machines Corporation
- Charles J. Blasi
- G01 - MEASURING TESTING
Information Patent Grant
ABIST-assisted detection of scan chain defects
- Patent number 7,225,374
- Issue date May 29, 2007
- International Business Machines Corporation
- Todd Michael Burdine
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic method for detection of multiple defects in a Level Sens...
- Patent number 7,107,502
- Issue date Sep 12, 2006
- International Business Machines Corporation
- Todd Michael Burdine
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for providing interactive testing of integrated c...
- Patent number 7,089,474
- Issue date Aug 8, 2006
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...
- Publication number 20080189583
- Publication date Aug 7, 2008
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DIAGNOSING A SC...
- Publication number 20080091999
- Publication date Apr 17, 2008
- International Business Machines Corporation
- Todd M. BURDINE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, apparatus, and computer program product for diagnosing a sc...
- Publication number 20070011523
- Publication date Jan 11, 2007
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for selective scan chain diagnostics
- Publication number 20060048028
- Publication date Mar 2, 2006
- International Business Machines Corporation
- Charles J. Blasi
- G01 - MEASURING TESTING
Information Patent Application
Method, apparatus, and computer program product for implementing de...
- Publication number 20050229057
- Publication date Oct 13, 2005
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Application
Method and system for providing interactive testing of integrated c...
- Publication number 20050204237
- Publication date Sep 15, 2005
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnostic method for detection of multiple defects in a Level Sens...
- Publication number 20050172188
- Publication date Aug 4, 2005
- International Business Machines Corporation
- Todd Michael Burdine
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE NTH STATE OF LINEAR FEEDBACK...
- Publication number 20050135621
- Publication date Jun 23, 2005
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABIST-assisted detection of scan chain defects
- Publication number 20050138514
- Publication date Jun 23, 2005
- International Business Machines Corporation
- Todd Michael Burdine
- G01 - MEASURING TESTING

Todd Michael Burdine

Person

Patents Grantslast 30 patents

implementing deterministic based broken scan chain diagnostics

Method, apparatus, and computer program product for diagnosing a sc...

Method for implementing deterministic based broken scan chain diagn...

Method, apparatus, and computer program product for diagnosing a sc...

System and method for determining the Nth state of linear feedback...

Method and apparatus for selective scan chain diagnostics

ABIST-assisted detection of scan chain defects

Diagnostic method for detection of multiple defects in a Level Sens...

Method and system for providing interactive testing of integrated c...

Patents Applicationslast 30 patents

APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DIAGNOSING A SC...

Method, apparatus, and computer program product for diagnosing a sc...

Method and apparatus for selective scan chain diagnostics

Method, apparatus, and computer program product for implementing de...

Method and system for providing interactive testing of integrated c...

Diagnostic method for detection of multiple defects in a Level Sens...

SYSTEM AND METHOD FOR DETERMINING THE NTH STATE OF LINEAR FEEDBACK...

ABIST-assisted detection of scan chain defects