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Todd Wayne Karry
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Kennebunk, ME, US
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last 30 patents
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Patent Grant
System and method for providing testing and failure analysis of int...
Patent number
7,484,143
Issue date
Jan 27, 2009
National Semiconductor Corporation
Lee James Jacobson
G11 - INFORMATION STORAGE
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Patent Grant
System and method for providing testing and failure analysis of int...
Patent number
7,216,270
Issue date
May 8, 2007
National Semiconductor Corporation
Lee James Jacobson
G11 - INFORMATION STORAGE