Tohru ANDO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for adjusting charged particle beam device and adjusting bea...
- Patent number 10,176,968
- Issue date Jan 8, 2019
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device enabling facilitated EBSD detector ana...
- Patent number 9,741,531
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Kazuyuki Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display screen with graphical user interface
- Patent number D780767
- Issue date Mar 7, 2017
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774516
- Issue date Dec 20, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774075
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Charged particle beam apparatus and program
- Patent number 9,412,557
- Issue date Aug 9, 2016
- Hitachi High-Technologies Corporation
- Mitsugu Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,129,773
- Issue date Sep 8, 2015
- Hitachi High-Technologies Corporation
- Tohru Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and device
- Patent number 8,754,664
- Issue date Jun 17, 2014
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- G01 - MEASURING TESTING
Information Patent Grant
Specified position identifying method and specified position measur...
- Patent number 8,442,300
- Issue date May 14, 2013
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection method and device that consider the effect...
- Patent number 8,309,922
- Issue date Nov 13, 2012
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Logical CAD navigation for device characteristics evaluation system
- Patent number 8,178,837
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tohru Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen inspection equipment and how to make the electron beam abs...
- Patent number 8,178,840
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing method and semiconductor tester
- Patent number 8,067,752
- Issue date Nov 29, 2011
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus
- Patent number 7,989,766
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor testing method and semiconductor tester
- Patent number 7,732,791
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Logical CAD navigation for device characteristics evaluation system
- Patent number 7,700,916
- Issue date Apr 20, 2010
- Hitachi High-Technologies Corporation
- Tohru Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen inspection equipment and how to make electron beam absorbe...
- Patent number 7,663,104
- Issue date Feb 16, 2010
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device Enabling Facilitated EBSD Detector Ana...
- Publication number 20160163504
- Publication date Jun 9, 2016
- Hitachi High-Technologies Corporation
- Kazuyuki TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
- Publication number 20160118218
- Publication date Apr 28, 2016
- Hitachi High-Technologies Corporation
- Kunji SHIGETO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Program
- Publication number 20150325408
- Publication date Nov 12, 2015
- Hitachi High-Technologies Corporation
- Mitsugu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150144804
- Publication date May 28, 2015
- Hitachi High-Technologies Corporation
- Tohru Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20150074523
- Publication date Mar 12, 2015
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Specimen Testing Device and Method for Creating Absorbed Current Image
- Publication number 20130119999
- Publication date May 16, 2013
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Device
- Publication number 20130112871
- Publication date May 9, 2013
- Yasuhiko Nara
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SEMICONDUCTOR USING ABSORBED CU...
- Publication number 20110291692
- Publication date Dec 1, 2011
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION METHOD AND DEVICE THAT CONSIDER THE EFFECT...
- Publication number 20110291009
- Publication date Dec 1, 2011
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Testing Method and Semiconductor Tester
- Publication number 20100200749
- Publication date Aug 12, 2010
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL CAD NAVIGATION FOR DEVICE CHARACTERISTICS EVALUATION SYSTEM
- Publication number 20100177954
- Publication date Jul 15, 2010
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
- Publication number 20100116986
- Publication date May 13, 2010
- Hitachi High-Technologies Corporation
- Tomoharu OBUKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION APPARATUS
- Publication number 20090250610
- Publication date Oct 8, 2009
- Hitachi High-Technologies Corporation
- Yasuhiko NARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Testing Method and Semiconductor Tester
- Publication number 20080237462
- Publication date Oct 2, 2008
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G01 - MEASURING TESTING
Information Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
- Publication number 20080203297
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Tomoharu OBUKI
- G01 - MEASURING TESTING
Information Patent Application
Specified position identifying method and specified position measur...
- Publication number 20070274593
- Publication date Nov 29, 2007
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logical CAD navigation for device characteristics evaluation system
- Publication number 20070124713
- Publication date May 31, 2007
- Tohru Ando
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Method for adjusting charged particle beam device and adjusting bea...

Charged particle beam device enabling facilitated EBSD detector ana...

Display screen with graphical user interface

Display screen with graphical user interface

Display screen with graphical user interface

Charged particle beam apparatus and program

Charged particle beam apparatus

Inspection method and device

Specified position identifying method and specified position measur...

Semiconductor inspection method and device that consider the effect...

Logical CAD navigation for device characteristics evaluation system

Specimen inspection equipment and how to make the electron beam abs...

Semiconductor testing method and semiconductor tester

Sample inspection apparatus

Semiconductor testing method and semiconductor tester

Logical CAD navigation for device characteristics evaluation system

Specimen inspection equipment and how to make electron beam absorbe...

Patents Applicationslast 30 patents

Charged Particle Beam Device Enabling Facilitated EBSD Detector Ana...

Charged Particle Beam Device and Method for Adjusting Charged Parti...

Charged Particle Beam Apparatus and Program

Charged Particle Beam Apparatus

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

Specimen Testing Device and Method for Creating Absorbed Current Image

Inspection Method and Device

METHOD AND APPARATUS FOR INSPECTING SEMICONDUCTOR USING ABSORBED CU...

SEMICONDUCTOR INSPECTION METHOD AND DEVICE THAT CONSIDER THE EFFECT...

Semiconductor Testing Method and Semiconductor Tester

LOGICAL CAD NAVIGATION FOR DEVICE CHARACTERISTICS EVALUATION SYSTEM

Specimen Inspection Equipment and How to Make the Electron Beam Abs...

SAMPLE INSPECTION APPARATUS

Semiconductor Testing Method and Semiconductor Tester

Specimen Inspection Equipment and How to Make the Electron Beam Abs...

Specified position identifying method and specified position measur...

Logical CAD navigation for device characteristics evaluation system