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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Pattern inspection method and apparatus, and pattern alignment method
Patent number
7,349,575
Issue date
Mar 25, 2008
Nippon Avionics Co., Ltd.
Shinichi Hattori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection status display method
Patent number
6,940,527
Issue date
Sep 6, 2005
Nippon Avionics Co., Ltd.
Shinichi Hattori
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Pattern inspection method and apparatus, and pattern alignment method
Publication number
20040264759
Publication date
Dec 30, 2004
Shinichi Hattori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection status display method
Publication number
20040098156
Publication date
May 20, 2004
Shinichi Hattori
G06 - COMPUTING CALCULATING COUNTING