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Tohru Ikeda
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Kawasaki, JP
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last 30 patents
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Patent Grant
Charged particle beam exposure method and apparatus
Patent number
5,895,924
Issue date
Apr 20, 1999
Fujitsu Limited
Hiroshi Yasuda
B82 - NANO-TECHNOLOGY
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Patent Grant
Electron-beam exposure device and a method of detecting a mark posi...
Patent number
5,708,276
Issue date
Jan 13, 1998
Fujitsu Limited
Tatsuro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS