Tohru KINUGAWA

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Osaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 8,772,708
- Issue date Jul 8, 2014
- National University Corporation Kobe University
- Tohru Kinugawa
- G01 - MEASURING TESTING
Information Patent Grant
Mass analysis data processing method and mass spectrometer
- Patent number 8,612,162
- Issue date Dec 17, 2013
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-turn time-of-flight mass spectrometer
- Patent number 8,492,711
- Issue date Jul 23, 2013
- Shimadzu Corporation
- Tohru Kinugawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20140054456
- Publication date Feb 27, 2014
- Tohru Kinugawa
- G01 - MEASURING TESTING
Information Patent Application
Multi-Turn Time-of-Flight Mass Spectrometer
- Publication number 20120112060
- Publication date May 10, 2012
- Shimadzu Corporation
- Tohru KINUGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analysis Data Processing Method and Mass Spectrometer
- Publication number 20110231109
- Publication date Sep 22, 2011
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS