Tohru Sasaki

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Fuchu-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 7,015,461
- Issue date Mar 21, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus
- Patent number 7,005,634
- Issue date Feb 28, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 6,800,848
- Issue date Oct 5, 2004
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization method for mass spectrometry and mass spectrometry appar...
- Patent number 6,590,205
- Issue date Jul 8, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ionization apparatus
- Publication number 20020139930
- Publication date Oct 3, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20020084408
- Publication date Jul 4, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization method for mass spectrometry and mass spectrometry appar...
- Publication number 20020020813
- Publication date Feb 21, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20010048074
- Publication date Dec 6, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS