Tohru Shiohama

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and program for mass spectrometer
- Patent number 11,456,167
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Maki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Tandem mass spectrometer
- Patent number 10,890,562
- Issue date Jan 12, 2021
- Shimadzu Corporation
- Hideki Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chromatograph mass spectrometer
- Patent number 10,794,880
- Issue date Oct 6, 2020
- Shimadzu Corporation
- Yutaro Yamamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 10,444,185
- Issue date Oct 15, 2019
- Shimadzu Corporation
- Atsushige Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Tandem mass spectrometer
- Patent number 10,332,733
- Issue date Jun 25, 2019
- Shimadzu Corporation
- Tohru Shiohama
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus control system and program for the same
- Patent number 9,759,734
- Issue date Sep 12, 2017
- Shimadzu Corporation
- Tohru Shiohama
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus control system and program for chromatograph me...
- Patent number 9,285,381
- Issue date Mar 15, 2016
- Shimadzu Corporation
- Tohru Shiohama
- G01 - MEASURING TESTING
Information Patent Grant
MS/MS type mass spectrometer and program therefor
- Patent number 9,269,558
- Issue date Feb 23, 2016
- Shimadzu Corporation
- Tohru Shiohama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,704,162
- Issue date Apr 22, 2014
- Shimadzu Corporation
- Tohru Shiohama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER AND PROGRAM FOR MASS SPECTROMETER
- Publication number 20190333750
- Publication date Oct 31, 2019
- SHIMADZU CORPORATION
- Maki SAITO
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20190170688
- Publication date Jun 6, 2019
- SHIMADZU CORPORATION
- Atsushige IKEDA
- G01 - MEASURING TESTING
Information Patent Application
TANDEM MASS SPECTROMETER
- Publication number 20180284065
- Publication date Oct 4, 2018
- SHIMADZU CORPORATION
- Hideki YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TANDEM MASS SPECTROMETER
- Publication number 20180218893
- Publication date Aug 2, 2018
- SHIMADZU CORPORATION
- Tohru SHIOHAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHROMATOGRAPH MASS SPECTROMETER
- Publication number 20140244185
- Publication date Aug 28, 2014
- Shimadzu Corporation
- Yutaro YAMAMURA
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Apparatus Control System And Program For The Same
- Publication number 20140020455
- Publication date Jan 23, 2014
- Shimadzu Corporation
- Tohru SHIOHAMA
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Apparatus Control System And Program For The Same
- Publication number 20140022254
- Publication date Jan 23, 2014
- Shimadzu Corporation
- Tohru SHIOHAMA
- G01 - MEASURING TESTING
Information Patent Application
MS/MS TYPE MASS SPECTROMETER AND PROGRAM THEREFOR
- Publication number 20130221214
- Publication date Aug 29, 2013
- Shimadzu Corporation
- Tohru Shiohama
- H01 - BASIC ELECTRIC ELEMENTS

Tohru Shiohama

Person

Patents Grantslast 30 patents

Mass spectrometer and program for mass spectrometer

Tandem mass spectrometer

Chromatograph mass spectrometer

Mass spectrometer and mass spectrometry method

Tandem mass spectrometer

Analyzing apparatus control system and program for the same

Analyzing apparatus control system and program for chromatograph me...

MS/MS type mass spectrometer and program therefor

Mass spectrometer

Patents Applicationslast 30 patents

MASS SPECTROMETER AND PROGRAM FOR MASS SPECTROMETER

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

TANDEM MASS SPECTROMETER

TANDEM MASS SPECTROMETER

CHROMATOGRAPH MASS SPECTROMETER

Analyzing Apparatus Control System And Program For The Same

Analyzing Apparatus Control System And Program For The Same

MS/MS TYPE MASS SPECTROMETER AND PROGRAM THEREFOR