Tohru Yasuda

Follow

Person

Kasugai, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and operation monitoring method for semiconduc...
- Patent number 8,742,786
- Issue date Jun 3, 2014
- Fujitsu Semiconductor Limited
- Kazufumi Komura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test method for the same
- Patent number 7,330,043
- Issue date Feb 12, 2008
- Fujitsu Limited
- Seiji Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test method for the same
- Patent number 6,885,212
- Issue date Apr 26, 2005
- Fujitsu Limited
- Seiji Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device and method for reading data
- Patent number 5,506,808
- Issue date Apr 9, 1996
- Fujitsu Limited
- Katsuyuki Yamada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND OPERATION MONITORING METHOD FOR SEMICONDUC...
- Publication number 20090243627
- Publication date Oct 1, 2009
- Fujitsu Microelectronics Limited
- Kazufumi KOMURA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test method for the same
- Publication number 20050156589
- Publication date Jul 21, 2005
- FUJITSU LIMITED
- Seiji Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test method for the same
- Publication number 20030234661
- Publication date Dec 25, 2003
- FUJITSU LIMITED
- Seiji Yamamoto
- G01 - MEASURING TESTING