Tokuhito Sasaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic wave detector with improved wavelength selection pr...
- Patent number 9,297,701
- Issue date Mar 29, 2016
- NEC Corporation
- Tokuhito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor package and electronic device equipped therewith
- Patent number 8,785,853
- Issue date Jul 22, 2014
- NEC Corporation
- Takao Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device and fabrication method therefor
- Patent number 7,777,288
- Issue date Aug 17, 2010
- NEC Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with temperature monitor members
- Patent number 7,741,692
- Issue date Jun 22, 2010
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device, method of manufacturing the same and met...
- Patent number 7,462,921
- Issue date Dec 9, 2008
- NEC Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal-type infrared detection element
- Patent number 7,417,229
- Issue date Aug 26, 2008
- NEC Corporatioin
- Tokuhito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit including a temperature monitor element and ther...
- Patent number 7,391,092
- Issue date Jun 24, 2008
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device
- Patent number 7,239,002
- Issue date Jul 3, 2007
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Process for preparing a bolometer material and bolometer device
- Patent number 6,512,229
- Issue date Jan 28, 2003
- NEC Corporation
- Tokuhito Sasaki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for forming metal oxide film
- Patent number 6,485,619
- Issue date Nov 26, 2002
- NEC Corporation
- Tokuhito Sasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Thin-film temperature-sensitive resistor material and production pr...
- Patent number 6,413,385
- Issue date Jul 2, 2002
- NEC Corporation
- Tokuhito Sasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Etching gas used for plasma-enhanced etching of vanadium oxide film...
- Patent number 6,333,270
- Issue date Dec 25, 2001
- NEC Corporation
- Tokuhito Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-film temperature-sensitive resistor material and production pr...
- Patent number 6,127,914
- Issue date Oct 3, 2000
- NEC Corporation
- Tokuhito Sasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for manufacturing thermal-type infrared sensor
- Patent number 5,966,590
- Issue date Oct 12, 1999
- Director General, Technical Research and Development Institute, Japan Defense...
- Hideo Wada
- G01 - MEASURING TESTING
Information Patent Grant
VOX film, wherein X is greater than 1.875 and less than 2.0, and a...
- Patent number 5,801,383
- Issue date Sep 1, 1998
- Masahiro Ota, Director General, Technical Research and Development Institute,...
- Hideo Wada
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a thin Hg.sub.1-x Cd.sub.x Te film
- Patent number 5,290,394
- Issue date Mar 1, 1994
- NEC Corporation
- Tokuhito Sasaki
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
INFRARED SENSOR MANUFACTURED BY METHOD SUITABLE FOR MASS PRODUCTION
- Publication number 20160238453
- Publication date Aug 18, 2016
- Tetsuo TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE DETECTOR WITH IMPROVED WAVELENGTH SELECTION PR...
- Publication number 20140319359
- Publication date Oct 30, 2014
- NEC Corporation
- Tokuhito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR PACKAGE AND ELECTRONIC DEVICE EQUIPPED THEREWITH
- Publication number 20120138803
- Publication date Jun 7, 2012
- TAKAO YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
Thermal-type infrared detection element
- Publication number 20060186339
- Publication date Aug 24, 2006
- NEC Corporation
- Tokuhito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Thermal-type infrared detection element
- Publication number 20060188400
- Publication date Aug 24, 2006
- NEC Corporation
- Tokuhito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit device
- Publication number 20050218471
- Publication date Oct 6, 2005
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit device
- Publication number 20050218470
- Publication date Oct 6, 2005
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit device, method of manufacturing the same and met...
- Publication number 20050221573
- Publication date Oct 6, 2005
- NEC ELECTRONICS CORPORATION
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device and fabrication method therefor
- Publication number 20050173775
- Publication date Aug 11, 2005
- NEC Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device
- Publication number 20050161822
- Publication date Jul 28, 2005
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
Method for forming metal oxide film
- Publication number 20020084182
- Publication date Jul 4, 2002
- NEC Corporation
- Tokuhito Sasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Etching gas used for plasma-enhanced etching of vanadium oxide film...
- Publication number 20020025683
- Publication date Feb 28, 2002
- NEC Corporation
- Tokuhito Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCHING GAS USED FOR PLASMA-ENHANCED ETCHING OF VANADIUM OXIDE FILM...
- Publication number 20020001961
- Publication date Jan 3, 2002
- TOKUHITO SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for preparing a bolometer material and bolometer device
- Publication number 20010028034
- Publication date Oct 11, 2001
- NEC Corporation
- Tokuhito Sasaki
- C30 - CRYSTAL GROWTH

Tokuhito Sasaki

Person

Patents Grantslast 30 patents

Electromagnetic wave detector with improved wavelength selection pr...

Infrared sensor package and electronic device equipped therewith

Integrated circuit device and fabrication method therefor

Integrated circuit device with temperature monitor members

Integrated circuit device, method of manufacturing the same and met...

Thermal-type infrared detection element

Integrated circuit including a temperature monitor element and ther...

Integrated circuit device

Process for preparing a bolometer material and bolometer device

Method for forming metal oxide film

Thin-film temperature-sensitive resistor material and production pr...

Etching gas used for plasma-enhanced etching of vanadium oxide film...

Thin-film temperature-sensitive resistor material and production pr...

Method for manufacturing thermal-type infrared sensor

VOX film, wherein X is greater than 1.875 and less than 2.0, and a...

Method of manufacturing a thin Hg.sub.1-x Cd.sub.x Te film

Patents Applicationslast 30 patents

INFRARED SENSOR MANUFACTURED BY METHOD SUITABLE FOR MASS PRODUCTION

ELECTROMAGNETIC WAVE DETECTOR WITH IMPROVED WAVELENGTH SELECTION PR...

INFRARED SENSOR PACKAGE AND ELECTRONIC DEVICE EQUIPPED THEREWITH

Thermal-type infrared detection element

Thermal-type infrared detection element

Integrated circuit device

Integrated circuit device

Integrated circuit device, method of manufacturing the same and met...

Integrated circuit device and fabrication method therefor

Integrated circuit device

Method for forming metal oxide film

Etching gas used for plasma-enhanced etching of vanadium oxide film...

ETCHING GAS USED FOR PLASMA-ENHANCED ETCHING OF VANADIUM OXIDE FILM...

Process for preparing a bolometer material and bolometer device