Tom Marivoet

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Erps-Kwerps, BE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,892,493
- Issue date Feb 6, 2024
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,726,126
- Issue date Aug 15, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,105,839
- Issue date Aug 31, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 10,935,503
- Issue date Mar 2, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 10,324,044
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of light emitting semiconductor...
- Patent number 9,638,741
- Issue date May 2, 2017
- KLA-Tencor Corporation
- Steven Boeykens
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20230393185
- Publication date Dec 7, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210018450
- Publication date Jan 21, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20190302033
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20160313257
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF LIGHT EMITTING SEMICONDUCTOR...
- Publication number 20130027543
- Publication date Jan 31, 2013
- KLA-Tencor Corporation
- Steven Boeykens
- G01 - MEASURING TESTING