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Tom T. Ho
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San Carlos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Bitmap cluster analysis of defects in integrated circuits
Patent number
8,190,952
Issue date
May 29, 2012
Rudolph Technologies, Inc.
Tom T. Ho
G11 - INFORMATION STORAGE
Information
Patent Grant
Analysis techniques for multi-level memory
Patent number
7,954,018
Issue date
May 31, 2011
Rudolph Technologies, Inc.
Tom T. Ho
G11 - INFORMATION STORAGE
Information
Patent Grant
Bitmap cluster analysis of defects in integrated circuits
Patent number
7,685,481
Issue date
Mar 23, 2010
MKS Instruments, Inc.
Tom T. Ho
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...
Publication number
20140236515
Publication date
Aug 21, 2014
Tom Thuy Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARCHITECTURE FOR ROOT CAUSE ANALYSIS, PREDICTION, AND MODELING AND...
Publication number
20130173332
Publication date
Jul 4, 2013
Tom Thuy Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARCHITECTURE AND METHODS FOR TOOL HEALTH PREDICTION
Publication number
20130080372
Publication date
Mar 28, 2013
Tom Thuy Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...
Publication number
20130030760
Publication date
Jan 31, 2013
Tom Thuy Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS
Publication number
20100235690
Publication date
Sep 16, 2010
MKS Instruments, Inc.
Tom T. Ho
G01 - MEASURING TESTING
Information
Patent Application
Analysis techniques for multi-level memory
Publication number
20080189582
Publication date
Aug 7, 2008
Yield Dynamics, Inc.
Tom T. Ho
G11 - INFORMATION STORAGE
Information
Patent Application
Bitmap cluster analysis of defects in integrated circuits
Publication number
20070011509
Publication date
Jan 11, 2007
Tom T. Ho
G01 - MEASURING TESTING