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Tom Tse
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Fault detection and control methodologies for ion implantation proc...
Patent number
6,960,774
Issue date
Nov 1, 2005
Advanced Micro Devices, Inc.
Elfido Coss, Jr.
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method and system for dose control during an ion implantation process
Patent number
6,797,967
Issue date
Sep 28, 2004
Advanced Micro Devices, Inc.
Tom Tse
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Fault detection and control methodologies for ion implantation proc...
Publication number
20050092939
Publication date
May 5, 2005
Elfido Coss
H01 - BASIC ELECTRIC ELEMENTS