Tom Waayers

Person

Sint Michielsgestel, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Testing of asynchronous reset logic
- Patent number 11,301,607
- Issue date Apr 12, 2022
- NXP B.V.
- Tom Waayers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Limited pin test interface with analog test bus
- Patent number 10,571,518
- Issue date Feb 25, 2020
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
Testing an integrated circuit device with multiple testing protocols
- Patent number 10,162,000
- Issue date Dec 25, 2018
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for digital circuit scan testing
- Patent number 9,465,072
- Issue date Oct 11, 2016
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
Testing of an integrated circuit with a plurality of clock domains
- Patent number 8,410,787
- Issue date Apr 2, 2013
- NXP B.V.
- Thomas F. Waayers
- G01 - MEASURING TESTING
Information Patent Grant
IC testing methods and apparatus
- Patent number 8,327,205
- Issue date Dec 4, 2012
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
IC testing methods and apparatus
- Patent number 7,945,834
- Issue date May 17, 2011
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
IC testing methods and apparatus
- Patent number 7,941,717
- Issue date May 10, 2011
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
IC testing methods and apparatus
- Patent number 7,941,719
- Issue date May 10, 2011
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
IC testing methods and apparatus
- Patent number 7,870,449
- Issue date Jan 11, 2011
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
Circuit interconnect testing arrangement and approach therefor
- Patent number 7,685,488
- Issue date Mar 23, 2010
- NXP B.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Grant
Test access architecture and method of testing a module in an elect...
- Patent number 7,620,866
- Issue date Nov 17, 2009
- NXP B.V.
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Module, electronic device and evaluation tool
- Patent number 7,571,068
- Issue date Aug 4, 2009
- NXP B.V.
- Thomas Franciscus Waayers
- G01 - MEASURING TESTING
Information Patent Grant
Testing of integrated circuits
- Patent number 7,409,612
- Issue date Aug 5, 2008
- NXP B.V.
- Leon Maria Albertus Van De Logt
- G01 - MEASURING TESTING
Information Patent Grant
Low pin count, high-speed boundary scan testing
- Patent number 7,124,340
- Issue date Oct 17, 2006
- Koninklijke Phillips Electronics N.V.
- Gerardus Arnoldus Antonius Bos
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for assemblages of intergrated circuit blocks
- Patent number 6,988,230
- Issue date Jan 17, 2006
- Koninklijke Philips Electronics N.V.
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF ASYNCHRONOUS RESET LOGIC
- Publication number 20210109153
- Publication date Apr 15, 2021
- NXP B.V.
- Tom Waayers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DIGITAL CIRCUIT SCAN TESTING
- Publication number 20160266201
- Publication date Sep 15, 2016
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Application
TESTING AN INTEGRATED CIRCUIT DEVICE WITH MULTIPLE TESTING PROTOCOLS
- Publication number 20130218507
- Publication date Aug 22, 2013
- NXP B.V.
- Tom WAAYERS
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT WITH A PLURALITY OF CLOCK DOMAINS
- Publication number 20100188096
- Publication date Jul 29, 2010
- NXP B.V.
- Thomas F. Waayers
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR
- Publication number 20090077438
- Publication date Mar 19, 2009
- Koninklijke Philips Electronics N.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Application
Ic Testing Methods and Apparatus
- Publication number 20090003424
- Publication date Jan 1, 2009
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Application
Ic Testing Methods and Apparatus
- Publication number 20080290878
- Publication date Nov 27, 2008
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Application
Ic Testing Methods and Apparatus
- Publication number 20080288842
- Publication date Nov 20, 2008
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Application
Ic Testing Methods and Apparatus
- Publication number 20080265906
- Publication date Oct 30, 2008
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Application
Ic Testing Methods and Apparatus
- Publication number 20080255780
- Publication date Oct 16, 2008
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Application
Test architecture and method
- Publication number 20070208970
- Publication date Sep 6, 2007
- KONINKLIJKE PHILIPS ELECTRONCIS N.V.
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Application
Testing of integrated circuits
- Publication number 20060100810
- Publication date May 11, 2006
- Koninklijke Philips Electronics N.V.
- Leon Maria Albertus Van De Logt
- G01 - MEASURING TESTING
Information Patent Application
Module, electronic device and evaluation tool
- Publication number 20050268193
- Publication date Dec 1, 2005
- Koninklijke Philips Electronics N.V.
- Thomas Franciscus Waayers
- G01 - MEASURING TESTING
Information Patent Application
Apparatus with a test interface
- Publication number 20040177300
- Publication date Sep 9, 2004
- Alexander Sebastian Biewenga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electronic device
- Publication number 20030079166
- Publication date Apr 24, 2003
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a testable electronic device
- Publication number 20030041296
- Publication date Feb 27, 2003
- Gerardus Arnoldus Antonius Bos
- G01 - MEASURING TESTING

Tom Waayers

Person

Patents Grantslast 30 patents

Testing of asynchronous reset logic

Limited pin test interface with analog test bus

Testing an integrated circuit device with multiple testing protocols

Method and system for digital circuit scan testing

Testing of an integrated circuit with a plurality of clock domains

IC testing methods and apparatus

IC testing methods and apparatus

IC testing methods and apparatus

IC testing methods and apparatus

IC testing methods and apparatus

Circuit interconnect testing arrangement and approach therefor

Test access architecture and method of testing a module in an elect...

Module, electronic device and evaluation tool

Testing of integrated circuits

Low pin count, high-speed boundary scan testing

Test arrangement for assemblages of intergrated circuit blocks

Patents Applicationslast 30 patents

TESTING OF ASYNCHRONOUS RESET LOGIC

METHOD AND SYSTEM FOR DIGITAL CIRCUIT SCAN TESTING

TESTING AN INTEGRATED CIRCUIT DEVICE WITH MULTIPLE TESTING PROTOCOLS

TESTING OF AN INTEGRATED CIRCUIT WITH A PLURALITY OF CLOCK DOMAINS

CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR

Ic Testing Methods and Apparatus

Ic Testing Methods and Apparatus

Ic Testing Methods and Apparatus

Ic Testing Methods and Apparatus

Ic Testing Methods and Apparatus

Test architecture and method

Testing of integrated circuits

Module, electronic device and evaluation tool

Apparatus with a test interface

Electronic device

Method for testing a testable electronic device