Tomas Tuma

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,598,733
- Issue date Mar 7, 2023
- FEI Company
- Tomas Tûma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,002,692
- Issue date May 11, 2021
- FEI Company
- Tomas Tuma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL...
- Publication number 20230003675
- Publication date Jan 5, 2023
- FEI Company
- Oleksii KAPLENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HI...
- Publication number 20220207256
- Publication date Jun 30, 2022
- FEI Company
- Michael James Owen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20210033548
- Publication date Feb 4, 2021
- FEI Company
- Tomás Tuma
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200393392
- Publication date Dec 17, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200363349
- Publication date Nov 19, 2020
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200057011
- Publication date Feb 20, 2020
- FEI Company
- Tomas Tuma
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method of examining a sample using a charged particle microscope

Method of examining a sample using a charged particle microscope

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL...

CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HI...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE