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Tomio Nakajima
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Yokohama, JP
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last 30 patents
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Patent Grant
AE/ultrasound detection system, and material monitoring apparatus a...
Patent number
7,719,689
Issue date
May 18, 2010
National Institute of Advanced Industrial Science and Technology
Jung-Ryul Lee
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
AE/ultrasound detection system, and material monitoring apparatus a...
Publication number
20080043243
Publication date
Feb 21, 2008
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Jung-Ryul Lee
G01 - MEASURING TESTING