Tommaso Torelli

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Berkeley, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer and lot based hierarchical method combining customized metric...
- Patent number 10,290,088
- Issue date May 14, 2019
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting one or more parameters for inspection of a wafer
- Patent number 9,601,393
- Issue date Mar 21, 2017
- KLA-Tencor Corp.
- Chris Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated image-based process monitoring and control
- Patent number 9,569,834
- Issue date Feb 14, 2017
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods and systems for classifying defects on...
- Patent number 8,532,949
- Issue date Sep 10, 2013
- KLA-Tencor Technologies Corp.
- Cho Huak Teh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED IMAGE-BASED PROCESS MONITORING AND CONTROL
- Publication number 20160371826
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Himanshu VAJARIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer and Lot Based Hierarchical Method Combining Customized Metric...
- Publication number 20150234379
- Publication date Aug 20, 2015
- KLA-Tencor Corporation
- Himanshu Vajaria
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selecting One or More Parameters for Inspection of a Wafer
- Publication number 20110320149
- Publication date Dec 29, 2011
- KLA-Tencor Corporation
- Chris Lee
- G01 - MEASURING TESTING
Information Patent Application
Computer-implemented methods and systems for classifying defects on...
- Publication number 20060082763
- Publication date Apr 20, 2006
- Cho Huak Teh
- G06 - COMPUTING CALCULATING COUNTING