Tomo TANAKA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis system, analysis method, and recording medium
- Patent number 12,307,201
- Issue date May 20, 2025
- NEC Corporation
- Taizo Shibuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bolometer and method for manufacturing same
- Patent number 12,055,440
- Issue date Aug 6, 2024
- NEC Corporation
- Ryota Yuge
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor and imaging apparatus
- Patent number 11,901,389
- Issue date Feb 13, 2024
- NEC Corporation
- Tomo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bolometer-type detector and method for manufacturing the same
- Patent number 11,733,102
- Issue date Aug 22, 2023
- NEC Corporation
- Tomo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Bolometer and method for manufacturing same
- Patent number 11,650,104
- Issue date May 16, 2023
- NEC Corporation
- Tomo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method and semiconductor element
- Patent number 11,495,458
- Issue date Nov 8, 2022
- NEC Corporation
- Tomo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Texture structure manufacturing method
- Patent number 11,195,963
- Issue date Dec 7, 2021
- NEC Corporation
- Tomo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BOLOMETER AND BOLOMETER ARRAY
- Publication number 20250155293
- Publication date May 15, 2025
- NEC Corporation
- Tomo Tanaka
- G01 - MEASURING TESTING
Information Patent Application
EXTRACTION DEVICE, IMAGE ANALYSIS DEVICE, CREATING DEVICE, EVALUATI...
- Publication number 20240394904
- Publication date Nov 28, 2024
- NEC Corporation
- Taizo SHIBUYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOLOMETER-TYPE INFRARED DETECTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240377261
- Publication date Nov 14, 2024
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
ELEMENT, BOLOMETER, AND ELEMENT MANUFACTURING METHOD
- Publication number 20240349610
- Publication date Oct 17, 2024
- NEC Corporation
- Tomo TANAKA
Information Patent Application
ELEMENT USING CARBON NANOTUBE FILM, A BOLOMETER USING THE SAME AND...
- Publication number 20240276863
- Publication date Aug 15, 2024
- NEC Corporation
- Tomo TANAKA
- B82 - NANO-TECHNOLOGY
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240210247
- Publication date Jun 27, 2024
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER-TYPE INFRARED DETECTOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20230384165
- Publication date Nov 30, 2023
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
DATA GENERATION SYSTEM, DATA GENERATION METHOD, AND RECORDING MEDIUM
- Publication number 20230376688
- Publication date Nov 23, 2023
- NEC Corporation
- Taizo Shibuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOLOMETER MATERIAL, INFRARED SENSOR AND METHOD FOR MANUFACTURING SAME
- Publication number 20230288262
- Publication date Sep 14, 2023
- NEC Corporation
- Ryota YUGE
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20230160750
- Publication date May 25, 2023
- NEC Corporation
- Ryota Yuge
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS METHOD, AND RECORDING MEDIUM
- Publication number 20230054146
- Publication date Feb 23, 2023
- NEC Corporation
- Taizo Shibuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOLOMETER-TYPE DETECTOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220333994
- Publication date Oct 20, 2022
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
STRETCH-FORMED PRODUCT
- Publication number 20220064401
- Publication date Mar 3, 2022
- NEC Corporation
- Tomo TANAKA
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20220034720
- Publication date Feb 3, 2022
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20220034721
- Publication date Feb 3, 2022
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR AND IMAGING APPARATUS
- Publication number 20210375974
- Publication date Dec 2, 2021
- NEC Corporation
- Tomo TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD AND SEMICONDUCTOR ELEMENT
- Publication number 20210217851
- Publication date Jul 15, 2021
- NEC Corporation
- Tomo TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEXTURE STRUCTURE MANUFACTURING METHOD
- Publication number 20210193851
- Publication date Jun 24, 2021
- NEC Corporation
- Tomo TANAKA
- H01 - BASIC ELECTRIC ELEMENTS

Tomo TANAKA

Person

Patents Grantslast 30 patents

Analysis system, analysis method, and recording medium

Bolometer and method for manufacturing same

Infrared sensor and imaging apparatus

Bolometer-type detector and method for manufacturing the same

Bolometer and method for manufacturing same

Manufacturing method and semiconductor element

Texture structure manufacturing method

Patents Applicationslast 30 patents

BOLOMETER AND BOLOMETER ARRAY

EXTRACTION DEVICE, IMAGE ANALYSIS DEVICE, CREATING DEVICE, EVALUATI...

BOLOMETER-TYPE INFRARED DETECTOR AND METHOD OF MANUFACTURING THE SAME

ELEMENT, BOLOMETER, AND ELEMENT MANUFACTURING METHOD

ELEMENT USING CARBON NANOTUBE FILM, A BOLOMETER USING THE SAME AND...

BOLOMETER AND METHOD FOR MANUFACTURING THE SAME

BOLOMETER-TYPE INFRARED DETECTOR AND METHOD FOR MANUFACTURING THE SAME

DATA GENERATION SYSTEM, DATA GENERATION METHOD, AND RECORDING MEDIUM

BOLOMETER MATERIAL, INFRARED SENSOR AND METHOD FOR MANUFACTURING SAME

BOLOMETER AND METHOD FOR MANUFACTURING SAME

ANALYSIS SYSTEM, ANALYSIS METHOD, AND RECORDING MEDIUM

BOLOMETER-TYPE DETECTOR AND METHOD FOR MANUFACTURING THE SAME

STRETCH-FORMED PRODUCT

BOLOMETER AND METHOD FOR MANUFACTURING SAME

BOLOMETER AND METHOD FOR MANUFACTURING SAME

INFRARED SENSOR AND IMAGING APPARATUS

MANUFACTURING METHOD AND SEMICONDUCTOR ELEMENT

TEXTURE STRUCTURE MANUFACTURING METHOD