Tomoaki Nanko

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
infrared gas analyzer and infrared gas analysis method
- Patent number 7,323,687
- Issue date Jan 29, 2008
- Yokogawa Electric Corporation
- Tomoaki Nanko
- G01 - MEASURING TESTING
Information Patent Grant
Moving mirror support device for photo-interferometer
- Patent number 6,322,037
- Issue date Nov 27, 2001
- Yokogawa Electric Corporation
- Tomoaki Nanko
- G02 - OPTICS
Information Patent Grant
Spectroscope utilizing a coupler to concurrently apply parallel lig...
- Patent number 5,715,055
- Issue date Feb 3, 1998
- Yokogawa Electric Corporation
- Tomoaki Nanko
- G01 - MEASURING TESTING
Information Patent Grant
Interference spectrometer with a moving mirror
- Patent number 5,592,292
- Issue date Jan 7, 1997
- Yokogawa Electric Corporation
- Tomoaki Nanko
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Infrared Gas Analyzer
- Publication number 20080093556
- Publication date Apr 24, 2008
- YOKOGAWA ELECTRIC CORPORATION
- Hideaki Yamagishi
- G01 - MEASURING TESTING
Information Patent Application
Infrared gas analyzer
- Publication number 20070046925
- Publication date Mar 1, 2007
- YOKOGAWA ELECTRIC CORPORATION
- Hideaki Yamagishi
- G01 - MEASURING TESTING
Information Patent Application
Infrared gas analyzer and infrared gas analysis method
- Publication number 20060118724
- Publication date Jun 8, 2006
- Tomoaki Nanko
- G01 - MEASURING TESTING