Tomoaki Yamada

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Processing system, measuring probe, shape measuring device, and pro...
- Patent number 11,989,887
- Issue date May 21, 2024
- Nikon Corporation
- Tomoaki Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing system, measuring probe, shape measuring device, and pro...
- Patent number 11,766,757
- Issue date Sep 26, 2023
- Nikon Corporation
- Tomoaki Yamada
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Program behavior monitoring control apparatus, distributed object c...
- Patent number 10,831,885
- Issue date Nov 10, 2020
- SOLITON SYSTEMS K.K.
- Tomoaki Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape measuring device, structured object manufacturing system, sha...
- Patent number 10,482,592
- Issue date Nov 19, 2019
- Nikon Corporation
- Tomoaki Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Profile measuring apparatus, structure manufacturing system, method...
- Patent number 9,188,432
- Issue date Nov 17, 2015
- Nikon Corporation
- Tomoaki Yamada
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Piezoelectric material and devices using the same
- Patent number 9,082,975
- Issue date Jul 14, 2015
- Canon Kabushiki Kaisha
- Makoto Kubota
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Profile measuring apparatus, method for measuring profile, and meth...
- Patent number 8,441,652
- Issue date May 14, 2013
- Nikon Corporation
- Tomoaki Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring device
- Patent number 8,314,849
- Issue date Nov 20, 2012
- Nikon Corporation
- Tomoaki Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring device and shape measuring method
- Patent number 8,244,023
- Issue date Aug 14, 2012
- Nikon Corporation
- Tomoaki Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Mark position detecting apparatus and mark position detecting method
- Patent number 7,197,176
- Issue date Mar 27, 2007
- Nikon Corporation
- Tatsuo Fukui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Maneto-optical recording apparatus with path length compensated dua...
- Patent number 4,853,923
- Issue date Aug 1, 1989
- Nikon Corporation
- Tomoaki Yamada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING SYSTEM, MEASURING PROBE, SHAPE MEASURING DEVICE, AND PRO...
- Publication number 20210082126
- Publication date Mar 18, 2021
- Nikon Corporation
- Tomoaki YAMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING SYSTEM, MEASUREMENT PROBE, SHAPE MEASUREMENT DEVICE, AND...
- Publication number 20210069847
- Publication date Mar 11, 2021
- Nikon Corporation
- Tomoaki YAMADA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROGRAM BEHAVIOR MONITORING CONTROL APPARATUS, DISTRIBUTED OBJECT C...
- Publication number 20180300474
- Publication date Oct 18, 2018
- SOLITON SYSTEMS K.K.
- Tomoaki Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE MEASURING DEVICE, STRUCTURED OBJECT MANUFACTURING SYSTEM, SHA...
- Publication number 20170132784
- Publication date May 11, 2017
- Nikon Corporation
- Tomoaki YAMADA
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC MATERIAL AND DEVICES USING THE SAME
- Publication number 20130127298
- Publication date May 23, 2013
- Canon Kabushiki Kaisha
- Makoto Kubota
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
PROFILE MEASURING APPARATUS, STRUCTURE MANUFACTURING SYSTEM, METHOD...
- Publication number 20130107032
- Publication date May 2, 2013
- Nikon Corporation
- Tomoaki YAMADA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METH...
- Publication number 20120246899
- Publication date Oct 4, 2012
- Tomoaki YAMADA
- G01 - MEASURING TESTING
Information Patent Application
PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METH...
- Publication number 20120069353
- Publication date Mar 22, 2012
- Nikon Corporation
- Tomoaki YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING DEVICE
- Publication number 20100328484
- Publication date Dec 30, 2010
- Nikon Corporation
- Tomoaki YAMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE MEASURING DEVICE AND METHOD, AND PROGRAM
- Publication number 20100328454
- Publication date Dec 30, 2010
- Nikon Corporation
- Tomoaki YAMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD
- Publication number 20100008543
- Publication date Jan 14, 2010
- Tomoaki Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mark position detecting apparatus and mark position detecting method
- Publication number 20040114792
- Publication date Jun 17, 2004
- Nikon Corporation
- Tatsuo Fukui
- G06 - COMPUTING CALCULATING COUNTING

Tomoaki Yamada

Person

Patents Grantslast 30 patents

Processing system, measuring probe, shape measuring device, and pro...

Processing system, measuring probe, shape measuring device, and pro...

Program behavior monitoring control apparatus, distributed object c...

Shape measuring device, structured object manufacturing system, sha...

Profile measuring apparatus, structure manufacturing system, method...

Piezoelectric material and devices using the same

Profile measuring apparatus, method for measuring profile, and meth...

Shape measuring device

Shape measuring device and shape measuring method

Mark position detecting apparatus and mark position detecting method

Maneto-optical recording apparatus with path length compensated dua...

Patents Applicationslast 30 patents

PROCESSING SYSTEM, MEASURING PROBE, SHAPE MEASURING DEVICE, AND PRO...

PROCESSING SYSTEM, MEASUREMENT PROBE, SHAPE MEASUREMENT DEVICE, AND...

PROGRAM BEHAVIOR MONITORING CONTROL APPARATUS, DISTRIBUTED OBJECT C...

SHAPE MEASURING DEVICE, STRUCTURED OBJECT MANUFACTURING SYSTEM, SHA...

PIEZOELECTRIC MATERIAL AND DEVICES USING THE SAME

PROFILE MEASURING APPARATUS, STRUCTURE MANUFACTURING SYSTEM, METHOD...

PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METH...

PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METH...

SHAPE MEASURING DEVICE

SHAPE MEASURING DEVICE AND METHOD, AND PROGRAM

SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD

Mark position detecting apparatus and mark position detecting method