Tomochika Takeshima

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspection device and semiconductor inspection method
- Patent number 12,094,138
- Issue date Sep 17, 2024
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device examination method and semiconductor device ex...
- Patent number 12,044,729
- Issue date Jul 23, 2024
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device, imaging device, microscope device, image p...
- Patent number 10,055,638
- Issue date Aug 21, 2018
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell analysis method, cell analysis device, and cell analysis program
- Patent number 9,405,958
- Issue date Aug 2, 2016
- Hamamatsu Photonics K.K.
- Norikazu Sugiyama
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Semiconductor fault analysis device and fault analysis method
- Patent number 8,885,919
- Issue date Nov 11, 2014
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FEATURE OUTPUT MODEL GENERATION SYSTEM, FEATURE OUTPUT MODEL GENERA...
- Publication number 20240290080
- Publication date Aug 29, 2024
- Hamamatsu Photonics K.K.
- Akari ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INCLINE ESTIMATION SYSTEM, INCLINE ESTIMATION METHOD, INCLINE ESTIM...
- Publication number 20240282000
- Publication date Aug 22, 2024
- Hamamatsu Photonics K.K.
- Akari ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOCAL POSITION ESTIMATION METHOD, FOCAL POSITION ESTIMATION SYSTEM,...
- Publication number 20240257490
- Publication date Aug 1, 2024
- HAMAMATSU PHOTONICS K.K.
- Tomochika TAKESHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOCAL POSITION ESTIMATION SYSTEM, FOCAL POSITION ESTIMATION METHOD,...
- Publication number 20240160089
- Publication date May 16, 2024
- Hamamatsu Photonics K.K.
- Akari ITO
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND SEMICONDUCTOR INSPECTION METHOD
- Publication number 20220301197
- Publication date Sep 22, 2022
- Hamamatsu Photonics K.K.
- Tomochika TAKESHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING SEMICONDUCTOR AND SEMICONDUCTOR INSPECTING DE...
- Publication number 20220301135
- Publication date Sep 22, 2022
- Hamamatsu Photonics K.K.
- Tomochika TAKESHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR APPARATUS EXAMINATION METHOD AND SEMICONDUCTOR APPARA...
- Publication number 20220221411
- Publication date Jul 14, 2022
- Hamamatsu Photonics K.K.
- Tomochika TAKESHIMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE EXAMINATION METHOD AND SEMICONDUCTOR DEVICE EX...
- Publication number 20220206063
- Publication date Jun 30, 2022
- Hamamatsu Photonics K.K.
- Tomochika TAKESHIMA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGING DEVICE, MICROSCOPE DEVICE, IMAGE P...
- Publication number 20180322329
- Publication date Nov 8, 2018
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CELL ANALYSIS METHOD, CELL ANALYSIS DEVICE, AND CELL ANALYSIS PROGRAM
- Publication number 20140064594
- Publication date Mar 6, 2014
- Hamamatsu Photonics K.K.
- Norikazu Sugiyama
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGING DEVICE, MICROSCOPE DEVICE, IMAGE P...
- Publication number 20130169787
- Publication date Jul 4, 2013
- HAMAMATSU PHOTONICS K. K.
- Tomochika Takeshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD
- Publication number 20130039565
- Publication date Feb 14, 2013
- HAMAMATSU PHOTONICS K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING

Tomochika Takeshima

Person

Patents Grantslast 30 patents

Semiconductor inspection device and semiconductor inspection method

Semiconductor device examination method and semiconductor device ex...

Image processing device, imaging device, microscope device, image p...

Cell analysis method, cell analysis device, and cell analysis program

Semiconductor fault analysis device and fault analysis method

Patents Applicationslast 30 patents

FEATURE OUTPUT MODEL GENERATION SYSTEM, FEATURE OUTPUT MODEL GENERA...

INCLINE ESTIMATION SYSTEM, INCLINE ESTIMATION METHOD, INCLINE ESTIM...

FOCAL POSITION ESTIMATION METHOD, FOCAL POSITION ESTIMATION SYSTEM,...

FOCAL POSITION ESTIMATION SYSTEM, FOCAL POSITION ESTIMATION METHOD,...

SEMICONDUCTOR INSPECTION DEVICE AND SEMICONDUCTOR INSPECTION METHOD

METHOD FOR INSPECTING SEMICONDUCTOR AND SEMICONDUCTOR INSPECTING DE...

SEMICONDUCTOR APPARATUS EXAMINATION METHOD AND SEMICONDUCTOR APPARA...

SEMICONDUCTOR DEVICE EXAMINATION METHOD AND SEMICONDUCTOR DEVICE EX...

IMAGE PROCESSING DEVICE, IMAGING DEVICE, MICROSCOPE DEVICE, IMAGE P...

CELL ANALYSIS METHOD, CELL ANALYSIS DEVICE, AND CELL ANALYSIS PROGRAM

IMAGE PROCESSING DEVICE, IMAGING DEVICE, MICROSCOPE DEVICE, IMAGE P...

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD