Tomoe Ikawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Capacitance measuring apparatus and capacitance measuring method
- Patent number 7,812,619
- Issue date Oct 12, 2010
- Agilent Technologies, Inc.
- Shinichi Tanida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Capacitance measuring apparatus and capacitance measuring method
- Publication number 20080068029
- Publication date Mar 20, 2008
- AGILENT TECHNOLOGIES, INC.
- Shinichi Tanida
- G01 - MEASURING TESTING