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Tomofumi Ikari
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Saitama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for generating terahertz wave
Patent number
7,710,637
Issue date
May 4, 2010
Riken
Tomofumi Ikari
G02 - OPTICS
Information
Patent Grant
Method and apparatus for inspecting target by tera-hertz wave spect...
Patent number
7,381,955
Issue date
Jun 3, 2008
Riken
Yuki Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting materials
Patent number
7,352,449
Issue date
Apr 1, 2008
Riken
Kodo Kawase
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING TERAHERTZ WAVE
Publication number
20090251767
Publication date
Oct 8, 2009
Riken
Tomofumi Ikari
G02 - OPTICS
Information
Patent Application
Method and equipment for judging target by tera heltz wave spectrom...
Publication number
20060219922
Publication date
Oct 5, 2006
Yuki Watanabe
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for detecting materials
Publication number
20050116170
Publication date
Jun 2, 2005
Riken
Kodo Kawase
G01 - MEASURING TESTING