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Tomoharu OBUKI
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection device
Patent number
8,816,712
Issue date
Aug 26, 2014
Hitachi High-Technologies Corporation
Mitsuhiro Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Specimen inspection equipment and how to make the electron beam abs...
Patent number
8,178,840
Issue date
May 15, 2012
Hitachi High-Technologies Corporation
Tomoharu Obuki
G01 - MEASURING TESTING
Information
Patent Grant
Sample inspection apparatus
Patent number
7,989,766
Issue date
Aug 2, 2011
Hitachi High-Technologies Corporation
Yasuhiko Nara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Specimen inspection equipment and how to make electron beam absorbe...
Patent number
7,663,104
Issue date
Feb 16, 2010
Hitachi High-Technologies Corporation
Tomoharu Obuki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Specimen Testing Device and Method for Creating Absorbed Current Image
Publication number
20130119999
Publication date
May 16, 2013
Hitachi High-Technologies Corporation
Tomoharu Obuki
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE
Publication number
20110140729
Publication date
Jun 16, 2011
Hitachi High-Technologies Corporation
Mitsuhiro Nakamura
G01 - MEASURING TESTING
Information
Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
Publication number
20100116986
Publication date
May 13, 2010
Hitachi High-Technologies Corporation
Tomoharu OBUKI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE INSPECTION APPARATUS
Publication number
20090250610
Publication date
Oct 8, 2009
Hitachi High-Technologies Corporation
Yasuhiko NARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
Publication number
20080203297
Publication date
Aug 28, 2008
Hitachi High-Technologies Corporation
Tomoharu OBUKI
G01 - MEASURING TESTING