Tomohide Watanabe

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection device and method of inspecting pattern
- Patent number 8,358,340
- Issue date Jan 22, 2013
- Kabushiki Kaisha Toshiba
- Ryoji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Focusing device, focusing method and a pattern inspecting apparatus
- Patent number 7,394,048
- Issue date Jul 1, 2008
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern evaluation apparatus and a method of pattern evaluation
- Patent number 5,602,645
- Issue date Feb 11, 1997
- Kabushiki Kaisha Toshiba
- Mitsuo Tabata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern defects inspection system
- Patent number 5,379,348
- Issue date Jan 3, 1995
- Kabushiki Kaisha Toshiba
- Toshiyuki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring non-linearity of a pattern edge
- Patent number 4,743,768
- Issue date May 10, 1988
- Kabushiki Kaisha Toshiba
- Tomohide Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Automatic focusing apparatus for a semiconductor pattern inspection...
- Patent number 4,577,095
- Issue date Mar 18, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Tomohide Watanabe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic focusing apparatus
- Patent number 4,230,940
- Issue date Oct 28, 1980
- Tokyo Shibaura Denki Kabushiki Kaisha
- Masana Minami
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION DEVICE AND METHOD OF INSPECTING PATTERN
- Publication number 20090303323
- Publication date Dec 10, 2009
- Ryoji Yoshikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING A PATTERN AND METHOD FOR MANUFA...
- Publication number 20080055606
- Publication date Mar 6, 2008
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING DEVICE, FOCUSING METHOD AND A PATTERN INSPECTING APPARATUS
- Publication number 20070200051
- Publication date Aug 30, 2007
- Hiromu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Tomohide Watanabe

Person

Patents Grantslast 30 patents

Pattern inspection device and method of inspecting pattern

Focusing device, focusing method and a pattern inspecting apparatus

Pattern evaluation apparatus and a method of pattern evaluation

Pattern defects inspection system

Method and apparatus for measuring non-linearity of a pattern edge

Automatic focusing apparatus for a semiconductor pattern inspection...

Automatic focusing apparatus

Patents Applicationslast 30 patents

PATTERN INSPECTION DEVICE AND METHOD OF INSPECTING PATTERN

APPARATUS AND METHOD FOR INSPECTING A PATTERN AND METHOD FOR MANUFA...

FOCUSING DEVICE, FOCUSING METHOD AND A PATTERN INSPECTING APPARATUS