Tomohiro Akada

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Kadoma, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring gap of liquid crystal cell
- Patent number 7,230,713
- Issue date Jun 12, 2007
- Otsuka Electronics Co., Ltd.
- Tomohiro Akada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring cell gap of VA liquid crystal panel
- Patent number 6,628,389
- Issue date Sep 30, 2003
- Otsuka Electronics Co., Ltd.
- Tomohiro Akada
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope
- Patent number 4,922,309
- Issue date May 1, 1990
- Otsuka Electronics Co., Ltd.
- Mitsunao Sekiwa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROFILE MEASUREMENT SYSTEM AND PROFILE MEASUREMENT METHOD
- Publication number 20150106057
- Publication date Apr 16, 2015
- OTSUKA ELECTRONICS CO., LTD.
- Kazuhiro SUGITA
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring gap of liquid crystal cell
- Publication number 20040233432
- Publication date Nov 25, 2004
- Tomohiro Akada
- G02 - OPTICS