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Tomohiro Ikeda
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Matsudo-city, JP
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Patents Grants
last 30 patents
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Patent Grant
Optical imaging system using lateral illumination for digital assays
Patent number
11,635,387
Issue date
Apr 25, 2023
ABBOTT JAPAN CO., LTD
Tomohiro Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Optical imaging system using lateral illumination for digital assays
Patent number
11,073,481
Issue date
Jul 27, 2021
ABBOTT JAPAN LLC
Tomohiro Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Optical imaging system using lateral illumination for digital assays
Patent number
10,324,041
Issue date
Jun 18, 2019
Abbott Japan Co., LTD.
Tomohiro Ikeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL IMAGING SYSTEM USING LATERAL ILLUMINATION FOR DIGITAL ASSAYS
Publication number
20210349031
Publication date
Nov 11, 2021
ABBOTT JAPAN LLC
Tomohiro Ikeda
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL IMAGING SYSTEM USING LATERAL ILLUMINATION FOR DIGITAL ASSAYS
Publication number
20190376902
Publication date
Dec 12, 2019
Abbott Japan Co., LTD.
Tomohiro Ikeda
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL IMAGING SYSTEM USING LATERAL ILLUMINATION FOR DIGITAL ASSAYS
Publication number
20180172594
Publication date
Jun 21, 2018
Abbott Japan Co., LTD.
Tomohiro Ikeda
G01 - MEASURING TESTING