TREA

Tomohiro Kamitsu

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  • Kobe, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Infrared ray detector
    • Patent number 8,648,307
    • Issue date Feb 11, 2014
    • Panasonic Corporation
    • Takayuki Nishikawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Process of making a semiconductor optical lens and a semiconductor...
    • Patent number 8,591,716
    • Issue date Nov 26, 2013
    • Panasonic Corporation
    • Yoshiaki Honda
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Grant

    Detecting sensor
    • Patent number D623546
    • Issue date Sep 14, 2010
    • Panasonic Electric Works Co., Ltd.
    • Takayuki Nishikawa
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Detecting sensor
    • Patent number D623547
    • Issue date Sep 14, 2010
    • Panasonic Electric Works Co., Ltd.
    • Takayuki Nishikawa
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Detecting sensor
    • Patent number D623548
    • Issue date Sep 14, 2010
    • Panasonic Electric Works Co., Ltd.
    • Takayuki Nishikawa
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Infrared detection unit using a semiconductor optical lens
    • Patent number 7,718,970
    • Issue date May 18, 2010
    • Panasonic Electric Works Co., Ltd.
    • Yoshiaki Honda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Infrared detector and process for fabricating the same
    • Patent number 7,671,335
    • Issue date Mar 2, 2010
    • Panasonic Electric Works Co., Ltd.
    • Takayuki Nishikawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents