Tomohiro Mihira

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Saitama-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and image adjustment method
- Patent number 12,362,134
- Issue date Jul 15, 2025
- Jeol Ltd.
- Tomohiro Mihira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam system and method of making focal adjustment of io...
- Patent number 9,646,805
- Issue date May 9, 2017
- Jeol Ltd.
- Tomohiro Mihira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam instrument
- Patent number 7,202,476
- Issue date Apr 10, 2007
- Jeol Ltd.
- Mitsuo Suga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Image Adjustment Method
- Publication number 20230100291
- Publication date Mar 30, 2023
- JEOL Ltd.
- Tomohiro Mihira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused Ion Beam System and Method of Making Focal Adjustment of Io...
- Publication number 20150136978
- Publication date May 21, 2015
- JEOL Ltd.
- Tomohiro Mihira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-particle beam instrument
- Publication number 20060219914
- Publication date Oct 5, 2006
- JEOL Ltd.
- Mitsuo Suga
- G01 - MEASURING TESTING