Tomohiro Nakamichi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Estimation model generation method and electron microscope
- Patent number 11,842,880
- Issue date Dec 12, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring aberration and electron microscope
- Patent number 11,764,029
- Issue date Sep 19, 2023
- Jeol Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and control method of optical system o...
- Patent number 11,222,764
- Issue date Jan 11, 2022
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,720,302
- Issue date Jul 21, 2020
- Jeol Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Method of Correcting Aberration
- Publication number 20230026970
- Publication date Jan 26, 2023
- JEOL Ltd.
- Keito Aibara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Estimation Model Generation Method and Electron Microscope
- Publication number 20220262595
- Publication date Aug 18, 2022
- JEOL Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Measuring Aberration and Electron Microscope
- Publication number 20220230838
- Publication date Jul 21, 2022
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Control Method of Optical System o...
- Publication number 20200343072
- Publication date Oct 29, 2020
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20190272971
- Publication date Sep 5, 2019
- JEOL Ltd.
- Shigeyuki Morishita
- G01 - MEASURING TESTING