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Tomohiro Okuzaki

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  • Himeji-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    IMMUNOASSAY APPARATUS
    • Publication number 20200256868
    • Publication date Aug 13, 2020
    • SYSMEX CORPORATION
    • Toshiyuki SATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    IMMUNOASSAY APPARATUS
    • Publication number 20180024128
    • Publication date Jan 25, 2018
    • SYSMEX CORPORATION
    • Toshiyuki SATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER AND METHOD FOR LOADING REAGENT CONTAINER
    • Publication number 20140295562
    • Publication date Oct 2, 2014
    • SYSMEX CORPORATION
    • Yuji WAKAMIYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER AND STORAGE MEDIUM
    • Publication number 20120275956
    • Publication date Nov 1, 2012
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZING APPARATUS
    • Publication number 20120004742
    • Publication date Jan 5, 2012
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER AND ERROR INFORMATION DISPLAYING METHOD
    • Publication number 20100238043
    • Publication date Sep 23, 2010
    • Sysmex Corporation
    • Yuji Wakamiya
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Sample analyzer and sample analyzing method
    • Publication number 20090215184
    • Publication date Aug 27, 2009
    • Sysmex Corporation
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer and method for analyzing samples
    • Publication number 20090081794
    • Publication date Mar 26, 2009
    • Sysmex Corporation
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer and error information displaying method
    • Publication number 20090082984
    • Publication date Mar 26, 2009
    • Sysmex Corporation
    • Yuji Wakamiya
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Sample analyzing apparatus
    • Publication number 20080279048
    • Publication date Nov 13, 2008
    • Sysmex Corporation
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER
    • Publication number 20080240988
    • Publication date Oct 2, 2008
    • Yuji WAKAMIYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample Analyzer
    • Publication number 20080240984
    • Publication date Oct 2, 2008
    • Sysmex Corporation
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample Analyzer
    • Publication number 20080240991
    • Publication date Oct 2, 2008
    • Sysmex Corporation
    • Yuji Wakamiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer and sample analyzing method
    • Publication number 20080241937
    • Publication date Oct 2, 2008
    • Sysmex Corporation
    • Yuji Wakamiya
    • G01 - MEASURING TESTING