Tomohiro Rokugawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Physical quantity measuring device and method of manufacturing the...
- Patent number 9,952,114
- Issue date Apr 24, 2018
- Nagano Keiki Co., Ltd.
- Hiroyuki Toba
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity measuring device
- Patent number 9,581,518
- Issue date Feb 28, 2017
- Nagano Keiki Co., Ltd.
- Hidebumi Seki
- G01 - MEASURING TESTING
Information Patent Grant
Detector
- Patent number 7,568,834
- Issue date Aug 4, 2009
- Nagano Keiki Co., Ltd.
- Hidebumi Seki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHYSICAL QUANTITY MEASURING DEVICE
- Publication number 20150276535
- Publication date Oct 1, 2015
- NAGANO KEIKI CO., LTD.
- Hidebumi Seki
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY MEASURING DEVICE AND METHOD OF MANUFACTURING THE...
- Publication number 20150276537
- Publication date Oct 1, 2015
- NAGANO KEIKI CO., LTD.
- Hiroyuki Toba
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR
- Publication number 20080165828
- Publication date Jul 10, 2008
- NAGANO KEIKI CO., LTD.
- Hidebumi Seki
- G01 - MEASURING TESTING