Tomohiro Takagi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Information processing to search for related expressions
- Patent number 10,380,151
- Issue date Aug 13, 2019
- Sony Corporation
- Masanori Miyahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 10,025,881
- Issue date Jul 17, 2018
- Sony Corporation
- Katsuyoshi Kanemoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Content recommendation device, recommended content search method, a...
- Patent number 9,864,747
- Issue date Jan 9, 2018
- Sony Corporation
- Naoki Kamimaeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluorescent labeling reagent
- Patent number 7,842,505
- Issue date Nov 30, 2010
- Keio University
- Kunihiro Noda
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20150169727
- Publication date Jun 18, 2015
- SONY CORPORATION
- Kazunori Araki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20150052140
- Publication date Feb 19, 2015
- SONY CORPORATION
- MASANORI MIYAHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20150046417
- Publication date Feb 12, 2015
- Sony Corporation
- Katsuyoshi Kanemoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTENT RECOMMENDATION DEVICE, RECOMMENDED CONTENT SEARCH METHOD, A...
- Publication number 20120254310
- Publication date Oct 4, 2012
- SONY CORPORATION
- Naoki KAMIMAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLUORESCENT LABELING REAGENT
- Publication number 20080124806
- Publication date May 29, 2008
- KEIO UNIVERSITY
- Kunihiro Noda
- G01 - MEASURING TESTING