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Tomohiro TAMORI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Pattern measurement device and pattern measurement method
Patent number
12,174,551
Issue date
Dec 24, 2024
Hitachi High-Technologies Corporation
Takuma Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern measurement device and pattern measurement method
Patent number
11,353,798
Issue date
Jun 7, 2022
Hitachi High-Technologies Corporation
Takuma Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern measurement device and pattern measurement method
Patent number
10,816,332
Issue date
Oct 27, 2020
HITACHI HIGH-TECH CORPORATION
Hiroya Ohta
G01 - MEASURING TESTING
Information
Patent Grant
Sample observation device having a selectable acceleration voltage
Patent number
10,141,159
Issue date
Nov 27, 2018
Hitachi High-Technologies Corporation
Ayumi Doi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Pattern Measurement Device and Pattern Measurement Method
Publication number
20220260930
Publication date
Aug 18, 2022
HITACHI HIGH-TECH CORPORATION
Takuma Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Charged Particle Beam System and Overlay Shift Amount Measurement M...
Publication number
20210055098
Publication date
Feb 25, 2021
HITACHI HIGH-TECH CORPORATION
Takuma YAMAKI
G01 - MEASURING TESTING
Information
Patent Application
Pattern Measurement Device and Pattern Measurement Method
Publication number
20200292308
Publication date
Sep 17, 2020
Hitachi High-Technologies Corporation
Hiroya OHTA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pattern Measurement Device and Pattern Measurement Method
Publication number
20200278615
Publication date
Sep 3, 2020
Hitachi High-Technologies Corporation
Takuma YAMAMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sample Observation Device
Publication number
20150371816
Publication date
Dec 24, 2015
Hitachi High-Technologies Corporation
Ayumi DOI
H01 - BASIC ELECTRIC ELEMENTS