Tomohisa Sezaki

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scan test control method and scan test circuit
- Patent number 7,155,649
- Issue date Dec 26, 2006
- Matsushita Electric Industrial Co., Ltd.
- Toshinobu Nakao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DATA PROCESSING METHOD AND SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20120096335
- Publication date Apr 19, 2012
- PANASONIC CORPORATION
- Tsukasa TAKAHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE, AND DEVELOPMENT SUPPORTING DEVICE
- Publication number 20100090718
- Publication date Apr 15, 2010
- Atsushi Ubukata
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING SYSTEM, DEBUGGING APPARATUS AND METHOD
- Publication number 20090063907
- Publication date Mar 5, 2009
- Matsushita Electric Industrial Co., Ltd.
- Nobuhiro TSUBOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan test control method and scan test circuit
- Publication number 20040181723
- Publication date Sep 16, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Toshinobu Nakao
- G01 - MEASURING TESTING