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Tomohito Nakano

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  • Kyoto, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Mass spectrometer
    • Patent number 11,721,536
    • Issue date Aug 8, 2023
    • Shimadzu Corporation
    • Manabu Ueda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    ICP mass spectrometer
    • Patent number 10,354,853
    • Issue date Jul 16, 2019
    • Shimadzu Corporation
    • Tomohito Nakano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Shutter
    • Patent number 10,354,854
    • Issue date Jul 16, 2019
    • Shimadzu Corporation
    • Tomohito Nakano
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Mass spectrometer with movable ionization chamber
    • Patent number 9,633,826
    • Issue date Apr 25, 2017
    • Shimadzu Corporation
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ionization probe
    • Patent number 9,254,497
    • Issue date Feb 9, 2016
    • Shimadzu Corporation
    • Tomohito Nakano
    • B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
  • Information Patent Grant

    Vacuum analyzer utilizing resistance tubes to control the flow rate...
    • Patent number 9,214,327
    • Issue date Dec 15, 2015
    • Shimadzu Corporation
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Rack with movable shielding component, and auto-sampler having the...
    • Patent number 9,146,217
    • Issue date Sep 29, 2015
    • Shimadzu Corporation
    • Tomohito Nakano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe
    • Patent number 9,008,496
    • Issue date Apr 14, 2015
    • Shimadzu Corporation
    • Tomohito Nakano
    • F24 - HEATING RANGES VENTILATING
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,927,929
    • Issue date Jan 6, 2015
    • Shimadzu Corporation
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,354,636
    • Issue date Jan 15, 2013
    • Shimadzu Corporation
    • Tomohito Nakano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,173,958
    • Issue date May 8, 2012
    • Shimadzu Corporation
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20210391164
    • Publication date Dec 16, 2021
    • SHIMADZU CORPORATION
    • Manabu UEDA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ICP ANALYSIS DEVICE
    • Publication number 20190115746
    • Publication date Apr 18, 2019
    • SHIMADZU CORPORATION
    • Tomohito NAKANO
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    ICP MASS SPECTROMETER
    • Publication number 20190013192
    • Publication date Jan 10, 2019
    • SHIMADZU CORPORATION
    • Tomohito NAKANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SHUTTER
    • Publication number 20180204713
    • Publication date Jul 19, 2018
    • SHIMADZU CORPORATION
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    IONIZATION PROBE
    • Publication number 20150060566
    • Publication date Mar 5, 2015
    • Shimadzu Corporation
    • Tomohito NAKANO
    • B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
  • Information Patent Application

    PROBE
    • Publication number 20130243412
    • Publication date Sep 19, 2013
    • Shimadzu Corporation
    • Tomohito NAKANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    VACUUM ANALYZER
    • Publication number 20130134306
    • Publication date May 30, 2013
    • SHIMADZU CORPORATION
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Rack, and Auto-Sampler Having the Rack
    • Publication number 20120222502
    • Publication date Sep 6, 2012
    • Shimadzu Corporation
    • Tomohito NAKANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20110204223
    • Publication date Aug 25, 2011
    • Shimadzu Corporation
    • Tomohito NAKANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20100264307
    • Publication date Oct 21, 2010
    • SHIMADZU CORPORATION
    • Tomohito Nakano
    • H01 - BASIC ELECTRIC ELEMENTS