Tomohito NAKANO

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and capturing condition adjusting meth...
- Patent number 10,770,266
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Tomohito Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for adjusting imaging co...
- Patent number 10,566,172
- Issue date Feb 18, 2020
- Hitachi High-Technologies Corporation
- Tomohito Nakano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device
- Publication number 20240062986
- Publication date Feb 22, 2024
- Hitachi High-Tech Corporation
- Naho TERAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR ADJUSTING IMAGE CAPTUR...
- Publication number 20230230796
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Tomohito NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Capturing Condition Adjusting Meth...
- Publication number 20200035449
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Tomohito NAKANO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus and Method for Adjusting Imaging Co...
- Publication number 20190172676
- Publication date Jun 6, 2019
- Hitachi High-Technologies Corporation
- Tomohito NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetic Field Analysis Calculation Method, Magnetic Circuit Calcul...
- Publication number 20180188335
- Publication date Jul 5, 2018
- Hitachi, Ltd
- Kazutami TAGO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALCULATION OF ELECTROMAGNETIC FORCE DISTRIBUTION, AND DEVICE FOR C...
- Publication number 20170315002
- Publication date Nov 2, 2017
- Hitachi, Ltd
- Tomohito NAKANO
- G01 - MEASURING TESTING